Ethos采用样品加工位置调整与低加速氩离子束精加工相结合的ACE技术,可制备出高质量的TEM薄膜样品。 ACE: Anti Curtaining Effect Triple Beam System(氩气/氙气) GUI设计进一步提升了视觉美观和响应速度 4种信号可供选择 ■ In-Column探测器(SED×1、BSE×2)与样品仓SE探测器可同时采集信号■ 搭载各SEM光学...
透射电子显微镜(TEM):用于更深入的材料内部结构分析,与FIB-SEM结合可提供全面的微观表征。 扫描探针显微镜(SPM):用于表面形貌和物理特性的纳米级分析,结合使用可获得更全面的材料信息。 能谱仪(EDS):可与FIB-SEM联用,进行元素成分分析,提供材料的化学组成信息。 X射线衍射仪(XRD):用于分析材料的晶体结构,与FIB-SE...
Im Allgemeinen sind Stoßdämpfer, die an den Aufhängungssystemen von Automobilen oder anderen Fahrzeugen angebracht sind, wie folgt aufgebaut. Ein Kolben, der mit einer Kolbenstange verbunden ist, ist verschiebbar in einen Zylinder eingepasst, der darin abgedichtet ein Fluid aufweist...
Micro-sampling System Language This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system. Contact Us Features System configuration example Observation case ...
Sarath P. R., Manikandan R, and Yoshiki Niwa. 2017. Hitachi at semeval-2017 task 12: System for tem- poral information extraction from clinical notes. In SemEval@ACL.Sarath P R, Manikandan R, and Yoshiki Niwa. 2017. Hitachi at SemEval-2017 Task 12: System for tem- poral information ...
Governance Framework for Promoting Environmental Governance Structure GRI 2-12/2-13/2-24 To achieve our Environmental Vision and Hitachi Environmental Innovation 2050 long-term tar- gets, Hitachi is building a global system to support decision-making and environmental manage- ment for Hitachi,...
A battery monitoring system, comprises a battery state detection circuit that detects battery states of a plurality of battery cells that are connected in series, based on respectiv
For cross-sectional observation, the CBMS-coated substrates were embedded in resin and thinned using a Hitachi NB5000 focused ion beam SEM system (Hitachi Co., Ltd., Tokyo, Japan) via a microsampling technique to prepare transmission electron microscope (TEM) samples. The substrates coated with ...
Users can image electron transparent samples like nanoparticles or biological sections with high contrast and remarkable ease than traditional SEM and TEM. For instance, the TM4000 can be employed for sample screening before high-throughput imaging of pigments in polymers, complete TEM examination, or...
The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low... Scanning Electron Microscope -- S-3700N The S-3700N's huge sample chamber...