Hitachi High-Tech Launches the GT2000, High-Precision Electron Beam Metrology System to Meet the Needs of Semiconductor Devices Development and Mass Production in the High-NA EUV Generation LEARN MORE SERIALS The World through an Electron Microscope Part 6 ...
Hitachi High-Tech Manufacturing & Service Corp. Hitachi High-Tech Science Corporation Hitachi High-Tech Kyushu Corporation Giesecke & Devrient Kabushiki Kaisha Chorus Call Asia Corporation NeU Corporation e-Associates Inc. Korea Hitachi High-Tech Korea Co.,Ltd. (한국어) ...
Hitachi High-Tech Corp.Request InfoThe DI2800 Dark Field Wafer Defect Inspection System from Hitachi High-Tech Corp. is a high-speed metrology system designed to identify defects and particles on patterned wafers up to 8 in. in diameter. With its high throughput and performance, the DI2800 ...
focused ion beam system from Hitachi High-Tech (Fig. 1) is equipped with a Cut&See feature that allows automated three-dimensional analysis. Because this instrument allows observations via a scanning ion microscope (SIM), it can be used to obtain clear images even for samples susceptible to ch...
KUSANO KAZUMI (JP) Application Number: DE60316095A Publication Date: 10/18/2007 Filing Date: 11/10/2003 Export Citation: Click for automatic bibliography generation Assignee: HITACHI HIGH TECH CORP (JP) International Classes: G01F23/00G01N35/10G01N35/00...
With use of deceleration mode (optional) References Sato M., History of Technologies in high resolution SEM,Kobunshi, 9 (2014)(Japanese). Authors *1 Shigeaki Tachibana, Hitachi High-Tech Corp., Marketing Department *2 William Podrazky, Hitachi High-Tech America, Inc....
Click for automatic bibliography generation Assignee: HITACHI HIGH TECH CORP (Tokyo, JP) International Classes: G01N35/00G01N35/02 Foreign References: JP2010281845A2010-12-16 Attorney, Agent or Firm: Strehl Schübel-Hopf & Partner mbB Patentanwälte European Patent Attorneys (München, DE) ...
Ionenmikroskop, umfassend:eine Feldionisations-Ionenquelle (1) mit einer Emitterspitze (21) mit einem nadelförmigen Ende, einer Ionisationskammer (15), in der sich die Emitterspitze (21) befindet, einer Leitung (25) zum Zuführen von Gasmolekülen in die Umgebung der Emitterspitze (21),...
Company NameYamashita Materials Corp. LocationZama-City , Kanagawa, JAPAN EstablishedJune 15th, 1965 Capital250 Million JPY Net Sales (FY ended 3/31/2019)2,520 Million JP (year 2021) Number of Employees137 Yamashita Materials Corp. Official Website ...
Click for automatic bibliography generation Assignee: HITACHI HIGH TECH CORP (Tokyo, JP) International Classes: H01J37/26G01N23/2206H01J37/21H01J37/244H01J37/28 Foreign References: 20170271124 JP200795576A Other References: G. D. Danilatos, Backscattered electron detection in environmental SEM, ...