Scanning Electron Microscope FlexSEM 1000 II FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional...
FE-SEM (Field Emission Scanning Electron Microscopes) With the adoption of high brightness FE electron source, FE-SEM can more highly focus electron beam than conventional SEM employing thermionic electron source, and hence can obtain higher resolution. It also provides rather clear images even at ...
Field EmissionTransmission Electron Microscope HF5000 Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX ...
Price from $9.99to $1999.99 transmission electron microscope tem model hitachi h 7100- byBioz Stars,2024-12 86/100stars Buy from Supplier 透過型電子顕微 鏡 tem : h 7100 hitachi japan(Rigaku Corporation) 86 Rigaku Corporation透過型電子顕微 鏡 tem : h 7100 hitachi japan ...
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Electron MicroscopeHitachiThe new HT7700 120 kV transmission electron microscope (TEM) from Hitachi High-Technologies is set to make life much easier for microscopists. The revolutionary HT7700 features 100% integration of all functions into the graphical user interface. The HT7700 is the latest ...
Scanning Electron Microscope FlexSEM 1000 II Language FlexSEM 1000 II The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides ...
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SEM SCANNING ELECTRON MICROSCOPE SERVICES - Hitachi S-4800 Scanning Electron Microscopy (SEM) Imaging and EDX Spectroscopy Materials Analysis Services S-4700, S4500 - services on HTE Labs Wafer Fab - Research and Development Laboratories for semiconduct
A method of operating an electron microscope under a high temperature and the electron microscope are provided. The electron microscope can stably set and efficiently heat a sample to observe and meas