The principles of grazing incidence X-ray diffraction (GIXD) are discussed. A sample of a crystalline material is composed of a surface region including its top layer and a bulk part. The effect of the surface region on the intensity of surface X-ray diffraction cannot be generally disregarded...
The sensitivity of GID to roughness is equivalent to that of x-ray specular reflection exper...Rugel, S., Wallner, G., Metzger, H., et al., Grazingincidence X-ray diffraction on ion-implanted silicon, J. Appl. Crystallogr. , 1993, vol. 26, no. 1, pp. 34–40....
X-ray diffraction/ interface structureultrathin interface layersDue to the strongly restricted penetration depth, X-ray diffraction under grazing incidence and exit allows observation and characterisation of ultra-thin interface layers down to thicknesses of one monolayer, even though it may be covered ...
1) X-Ray Grazing Incident Diffraction X射线掠入射2) grazing incidence X_ray diffraction 掠角入射X射线衍射 1. The structural properties of these thin films (In/Zn=0, 1, 2, 3 and 5at%) were studied by grazing incidence X_ray diffraction, conventional X_ray diffraction, Fourier transform ...
1.The structural properties of these thin films (In/Zn=0, 1, 2, 3 and 5at%) were studied bygrazing incidence X_ray diffraction, conventional X_ray diffraction, Fourier transform infrared spectroscopy, atomic force microscopy and photoluminescence.使用掠角入射X射线衍射(GI_XRD)、常规X射线衍射、傅...
必应词典为您提供grazing-incidence-x-ray-diffraction的释义,网络释义: 掠入射X射线衍射;X光低掠角;
X-ray diffractometer for grazing incidence diffraction of horizontally oriented samplesAn X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-...
1.The structural properties of these thin films (In/Zn=0, 1, 2, 3 and 5at%) were studied bygrazing incidence X_ray diffraction, conventional X_ray diffraction, Fourier transform infrared spectroscopy, atomic force microscopy and photoluminescence.使用掠角入射X射线衍射(GI_XRD)、常规X射线衍射、傅...
Grazing incidence synchrotron X-ray diffraction study of crystal orientation in microporous films.GrazingincidenceNanosizedzeolitesOrientedfilmsX-rayscatteringThin microporous films with MFI type structure were deposited on silicon wafers via the seed method and spin coating of a stable colloidal mixture ...
aGrazing incidence X-ray diffraction and transmission electron microscopy(including scanning TEM, EDS using nanoprobe, and HRTEM)analyses revealed the core-shell structure of the NPs. The above sol can be used to prepare Au@Pd core-shell NPs incorporated alumina coatings on glass substrates. The ...