2.1 GO粉末的表征与分析 氧化石墨烯的XRD图谱如图2(a)所示,从图2(a) 中可以看出,纯GO在2θ=9.9°处呈现出强衍射峰,此衍射峰对应GO(001)晶面的衍射峰,根据布拉格方程计算,其所对应的层间间距大约为 0.772 nm。这表明GO呈现出高度有序的结构。 氧化...
实施例2制备出的biobr、agbr、go以及三元复合物的xrd谱见图1,衍射峰为(001)、(002)、(101)、(102)、(110)、(112)、(200)(212)与biobr的四方晶系标准卡片jcpdsno.85-0862特征衍射峰与相一致,表明所合成的biobr属于四方晶型;agbr的特征衍射峰分别是(111)、(200)、(220)、(222)、(400),与agbr立方晶系的标...
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图3是GO的XRD谱图。首先,从图中可以看出,在10.1°处出现了一个明显的衍射峰,这是GO独有的(001)晶面衍射峰。这个峰的出现表明GO的层状结构得到了保留,并且可以用于表征GO的结构。其次,在20.0°处显示出石墨(002)晶面的衍射峰,这个峰的位置相较于鳞片石墨(26.0°)有略微的偏移。分析原因认为氧化剂将原始石墨进...
The GO XRD spectra display three prominent peaks at 2θ = 12, 26, and 43, primarily indexed as 001, confirming the layered structure of GO (Fig. 1c). Upon combining CeO2 with GO (Fig. 1d), the XRD pattern and crystalline structure remained unchanged. However, a slight shift in ...
27.图4是本发明实施例2中在sn:s=1:1下cnts-sns-sns2@go异质结构复合材料的xrd图; 28.图5(a)是本发明实施例2中在sn:s=1:1下cnts-sns-sns2@go异质结构复合材料的sem图(放大倍数为20000倍); 29.图5(b)是本发明实施例2中在sn:s=1:1下cnts-sns-sns2@go异质结构复合材料的sem图(放大倍数为40000倍...
The measured X-ray diffraction (XRD) patterns reveal the formation of a new diffraction peak at 14.68 degrees associated with the crystallographic GO (001) plane. This peak confirms the uniform substitution of GO into the PEO matrix. Key optical parameters of PEO/GO thin films are studied by ...
google.golang.org/api v0.54.0/go.mod h1:7C4bFFOvVDGXjfDTAsgGwDgAxRDeQ4X8NvUedIt6z3k= google.golang.org/api v0.56.0/go.mod h1:38yMfeP1kfjsl8isn0tliTjIb1rJXcQi4UXlbqivdVE= google.golang.org/appengine v1.1.0/go.mod h1:EbEs0AVv82hx2wNQdGPgUI5lhzA/G0D9YwlJXL52JkM= goo...
XRD spectra confirmed the successful formation of these samples and the characteristic peaks viz. (100), (002), (101), (102), (110), (103), (200), (112), (201), (004) and (202) had coincided well with the standard structure of ZnO43. The (001) Miller plane defines the ...