Genetic-Algorithm-based Test Pattern Generation for Crosstalk Faults between On-Chip Aggressor and VictimCrosstalkgenetic algorithmsATPGWith the shrinking feature size and increasing aspect ratios of interconnects in DSM chips, the coupling noise between adjacent interconnects has become a major signal ...
In this paper, we propose a Genetic Algorithm (GA) based Automatic Test Pattern Generation (ATPG) technique, enhanced by automated solution to an associated Boolean Satisfiability problem. The main insight is that given a specific internal trigger condition, it is not possible to attack an ...
A storage assignment heuristic method based on genetic algorithm for a pick-and-pass warehousing system 热度: A Genetic Algorithm Based Approach to Service Identification 热度: fault diagnosis system of induction motors based on neural network and genetic algorithm using stator current signals ...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Generation (ATPG) for digital circuits. Genetic Algorithms have been already proposed to solve this industrially critical problem, both on mono... F Corno,P Prinetto,M Rebaudengo,... - International Con...
The technique presented here applies a genetic algorithm to find minimal or near minimal test sets. The algorithm aims to minimise test sets that have been previously generated by an ATPG system and as such has been designed as a post-processor. The algorithm has been applied to a family of...
In this paper, we propose a Genetic Algorithm (GA) based Automatic Test Pattern Generation (ATPG) technique, enhanced by automated solution to an associated Boolean Satisfiability problem. The main insight is that given a specific internal trigger condition, it is not possible to attack an ...
A parallel technique for ATPG using genetic algorithmsThis paper presents a new technique for test pattern generation based on a genetic algorithm and parallel processing techniques. This new method offers compact test sets, compared to other methods, that achieve maximum coverage.Sabry...
ATPG for Crosstalk Delay Faults Using Multi-objective Genetic AlgorithmPower consumption and delay are two of the most important design criteria in today's deep submicron VLSI technology. Energy dissipation has become a major concern in today's VLSI technology with increasing use of wireless ...
Rodriguez, "A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms", Proc. International Test Conference, pp. 286-293, 1996.P. Girard, G. Landrault, S. Pravossoudovitch, and B. Rodriguez, "A Diagnostic ATPG for Delay Faults based on Genetic Algorithm," in Proc. IEEE Int. Test...
Parallel genetic algorithm for automatic generation of test sequences for digital circuits. In the Proc. Int. Conf. and Exhibition HPCN EUROPE, pp. 454-459, April 1996.Corno, F., Prinetto, P., Rebaudengo, M., and Reorda, M. S. (1996). A Parallel Genetic Algorithm for Automatic ...