The surface morphology was further characterized by atomic force microscopy (AFM). In addition, the structural integrity and the corresponding phase of the as-grown and annealed Ga2O3 epitaxial layers grown on c-plane sapphire substrates were evaluated by high-resolution x-ray diffraction (HR-XRD)...
A pair of lower cylindrical contacts was placed at a distance of 100 mm, while the bending force acted exactly in the axis of the testing machine, i.e., the upper cylindrical contact loaded the sample with a force acting on the identical arms of 50 mm. The maximum force achieved when ...