FLATNESS CORRECTING FUNCTION FOR ELECTRON MICROSCOPEPURPOSE: To correct automatically out of focusing generated by projections/ recesses (flatness) of a specimen or a stage therefore using an electron microscope.TAKAMI TAKASHI高見 尚
The envelope of electron microscope transfer functions for partially coherent illumination It is known that the linear transfer theory of optical image formation remains valid for partially coherent illumination, provided that the object contrast is small. Starting from the results of the theory of coher...
as shown in Fig.2a. The optimized thickness of the γ-InSe flake (~240 nm) is recorded by atomic force microscope (AFM) (see Supplementary information Fig.S1). More opto-sensors with different
Mitochondria can be seen in the light microscope, but their detailed internal structure is only revealed by electron microscopy. In the 1990s, the structure of mitochondria was investigated by electron tomography of thin plastic sections [14]. While this yielded striking three-dimensional (3D) images...
CuNPs capped with oleylamine were synthesised using a method reported by Grouchko et al.29. Figure1a, b(and Supplementary Fig.1) shows representative Annular Dark Field Scanning Transmission Electron Microscope (ADF-STEM) images of oleylamine-capped CuNPs, from which it is evident that they are ...
First, the microstructure obtained by annealing amorphous LiV3O8 cathode films at different temperatures (150 °C and 300 °C) are studied by transmission electron microscope (TEM) to observe grain size, morphology, crystallography and crystallinity. Second, electrochemical testing results of LiV3O8...
Through the pioneering work of a few laboratories, the electron microscope has been transformed into a tool of quantitative structure research. Its role in the three-dimensional analysis of biomolecular assemblies having high complexity has been firmly established, and was recently recognized in the awa...
The dielectric function of 伪-Al2O3 was measured by electron energy-loss spectroscopy (EELS) coupled with the difference method. The influence of Cerenkov radiation was significant in measurements using a 200 kV transmission electron microscope (TEM) and the correct dielectric function could not be...
DeepFocus: fast focus and astigmatism correction for electron microscopy Article Open access 31 January 2024 Light-sheets and smart microscopy, an exciting future is dawning Article Open access 09 May 2023 Introduction Super-resolution structured illumination microscopy (SR-SIM), which breaks the ...
Characteristics of PM2.5 The shape and size of the particles were examined by electron microscopy. Most of the particles are irregular and the size are less than 2.5 microns (Supp. Fig.1). The composition of PM2.5sample used in this study includes carbon, water soluble ions, metal elements,...