In this short communication we describe the relationship between the periodicity of the diffraction singularities and higher-order reflections, which is relevant to the analysis of wedges with open angle less than pi. The discussion is provided specifically in the context of finite, three-dimensional ...
athis holds for both wide-angle diffraction and small-angle X-ray[translate] a你好,陌生人 正在翻译,请等待...[translate] a能源消费和实际GDP的最优预测模型选取了6个原始数据 The energy expense and the actual GDP most superior forecast model has selected 6 primary datas[translate] ...
The first-order dispersion relationship for gravity waves is used to show that the received spectrum from a patch of sea consists of two discrete Doppler shifts above and below the carrier, predictable from simple Bragg diffraction considerations. Using the Phillips wind-wave model as an upper ...
Angular distributions of the two ejected electrons resulting from the double ionization of helium by electron impact have been measured by means of a multicoincidence multiangle (e,3e) spectrometer at an incident energy of about 0.6 keV and equal outgoing energies E-b=E-c=11 eV. We identify ...
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Intuitively, in an optical setup involving two SLMs, one should expect that a lens has to be used in order to eliminate the effect of diffraction. In our case, however, we need the diffraction in order to allow the multiple-charged OV reflected from SLM1 to decay in to singly-charged ...
However, broader NiO diffraction peaks were also observed at 2θ = 43.3°, 64.3° and 75.3° corresponding to an average crystallite size of 6.5 to 8.4 nm which is lower than that for the monometallic catalyst (Table 1). One possible explanation is that CuO may help stabilize the ...
% apply angle threshold omega(omega > threshold) = NaN; % avoid grain boundaries if isfield(ebsd.prop,'grainId') omega( grainId(order+1:end-order,order+1:end-order) ~= ... grainId((order+1:end-order)+i,(order+1:end-order)+j) ) = NaN; end kam = fun(kam, omega .* weights...
High angle annular dark field (HAADF) images in scanning transmission electron microscopy (STEM) mode were recorded with a spot size of 0.5 nm and camera length of 115 mm. Electron backscatter diffraction (EBSD). The surface sample (of thick slides) was polished with alu- mina of ...
From pre-launch calibration, the full spectral range imaged on the sensor is 226 to 961 nm, but only the 400 to 800 nm range is used for nominal operations due to a low signal below 400 nm and second-order diffraction effects appearing above 800 nm. The spectral resolution was found to...