超高分辨场发射扫描电子显微镜 SU8600系列 随着快速数据采集和数据处理技术的发展,电子显微镜进入了一个不仅重视数据质量,而且重视其采集过程的时代。SU8600系列秉承了Regulus8200系列的高质量图像、大束流分析及长时间稳定运行的冷场成像技术,同时还大大提升了高通量、自动数据获取能力。
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM line-up. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, increased system stability, efficient workflows for users of all experience...
*1. FE-SEM:Field Emission Scanning Electron Microscope (场发射扫描电子显微镜) ■SU8600、SU8700的开发背景 FE-SEM获得的图像分辨率高,信息丰富,样品处理相对简单,并且它可以观察、测量并分析样品的细微结构,因此被广泛应用于纳米技术、半导体、电子器件、生命科学、材料等领域。近年来,以Materials Integration*2为代...
SU8600 为日立 SEM 长期存在的产品阵容带来了超高分辨率冷场发射扫描电子显微镜的新时代。SU8600 CFE-SEM平台融合了多方面的成像,自动化,更高的系统稳定性,适用于所有经验水平的用户的高效工作流程等。
HITACHI日立超高分辨场发射扫描电子显微镜 SU8600系列 距您较近 冷场发射 广州市君翔仪器仪表有限公司 3年 查看详情 ￥1.00万/台 广东东莞 德国蔡司场发射扫描电子显微镜Sigma 300纳米结构成像灵活探测 距您较近 东莞市三本精密仪器有限公司 6年 查看详情 ￥4500.00/台 广东深圳 日立高新场发射扫描电子显微镜SU...
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM line-up. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, increased system stability, efficient workflows for users of all experience...
2021 年 12 月 9 日 日立高新技术公司 支持数据驱动开发的两款 FE-SEM 隆重上市 强化自动获取大量数据功能,实现高效率观察 【场发射扫描电子显微镜 SU8600(左)SU8700(右)】 日立高新技术公司(以下简称日立高新技术)此次推出两款 FE-SEM*1"SU8600"和 "SU8700"(以下简称此系列产品),这两种型号配置自动获取大量...
The SU5000 was developed to address the various needs of SEM users in materials science, biomedicine, and many other fields. As the FE-SEM grows in popularity, Hitachi will continually place importance on functions such as EM Wizard, which are capable of providing high-resolution and optimized ...
In the SU7000 optical system, the accelerating voltage Vacc for electron-beam irradiation is boosted by an electrostatic field Vb at the objective lens that accelerates the electron beam emitted by the emitter. This configuration serves to reduce the value ofΔE/E inside the lens tube. The ele...
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM line-up. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, increased system stability, efficient workflows for users of all experience...