日本电子 JSM-7800F 热场发射扫描电子显微镜 SEM 加速电压 0.01 to 30kV 日本电子品牌 上海爱仪通网络科技有限公司 1年 查看详情 ￥185.00万/台 广东深圳 日本JEOL 场发射冷冻电子显微镜 JEM-Z200FSC 距您较近 深圳市科时达电子科技有限公司 4年 查看详情 ￥900.00万/台 上海 国仪量子 TH-F120 场发射透射...
掺加碳纤维的Fe_(2)O_(3)功能集料电磁防护混凝土 50 合成纤维 Synthetic Fiber in China 2022年第51卷第4期 PDF 卜車 掺加碳纤维的FezCh 功能集料电磁防护混凝土 朱毓豪，任俊儒* *,杨朝山，程华，黄晓寒，张左群收稿日期：2022-02-10 修回日期：2022-03-13 基金项目：军队后勤科研计划(BY117J007、...
The morphologies and structures of the prepared catalysts were studied by field emission scanning electron microscope (FESEM, JSM-7800F), transmission electron microscope (TEM, JEM-2800F), high-resolution TEM (HRTEM, JEM-2800F), aberration-corrected high-angle annular dark-field scanning transmission...
扫描电子显微镜(SEM)JEOLJSM-7800F 双恒电位仪瑞士万通AutolabPGSTAT302Nl 旋转圆盘电极装置PINEMSRAFMSRCE 电池测试柜NEWARECT-4008Tn 高温管式炉合肥科晶GSL-1800X-S60 电子分析天平德安特ES-J220A 冷冻干燥器CHRISTAlpha1-2LDPlus 鼓风干燥箱捷扬环保101-0A 台式循环水真空泵郑州鸿骏达SHZ-DIII防腐型 超声清洗...
Field emission scanning electron microscopy (FESEM, JSM-7800f), transmission electron microscopy (TEM, TALOS F200X) and high resolution transmission electron microscopy (HRTEM) were used to observe the microstructure and crystal structure of samples. The chemical elements and their relative contents ...
Scanning electron microscopy (SEM): Scanning electron microscopy was performed on a JSM-7800F super-resolution field emission scanning electron microscope from Japan Electronics Corporation, with an accelerating voltage of 5.0 kV and a resolution of 1.2 nm. A drop of the sample dispersion was...
(１.吉林师范大学功能材料物理与化学教育部重点实验室ꎬ吉林长春１３０１０３ꎻ２.吉林师范大学物理国家级实验教学示范中心ꎬ吉林四平１３６０００)摘㊀要:选用Ｆｅ３Ｏ４＠ＳｉＯ２＠ＺｎＯ作为基体材料ꎬ采用一步硫化法成功制备出Ｆｅ３Ｏ４＠ＳｉＯ２＠ＺｎＯ/ＺｎＳ纳米复合材料.通过ＸＲＤ㊁ＳＥＭ...
The crystal orientation and grain boundary misorientations of the composite coatings were examined by EBSD (FESEM, JEOL, JSM-7800F, Japan), at a 0.3 μm step size and operated at 20 kV. 2.3. Hardness and dry friction tests The microhardness of HEA coatings was tested by a hardness tester...
Scanning electron microscopy (SEM) investigations were performed on the prepared cross-sections of the specimen in a JSM-7800 F (JEOL Ltd., Japan), which was operating at 30 kV. For the following EBSD investigations, the EBSD camera EDAX Hikari Super Elite was used. The presented EBSD pattern...
The microstructures were observed by FE-SEM (JEOL JSM-7800F) at an accelerating voltage of 5 kV and WD = 10 mm on the raw material powder and the cross-sections parallel to the extrusion direction of the extrudate. The images were binarized and analyzed by ImageJ 1.53 k, which is an ...