These tools are a sequential, partial-scan automatic test pattern generator (ATPG) and an ATPG optimized for full-scan designs. Some customer results with these tools are presented as well.PuliniG.HamacherS.Design Automation Conference, 1993, with EURO-VHDL '93. Proceedings EURO-DAC '93., ...
内容提示: D A T A S H E E Twww.mentor.comSilicon Test and Yield AnalysisTessent FastScan Advanced Automatic Test Pattern GenerationIndustry Leading ATPGMentor Graphics Tessent ™ FastScan ™ is an automatic test pattern generation (ATPG) solution with a wide range of fault models, ...
It should be noted that for RTL input, the sequential mapping is performed to produce the FF's. Thereafter, it is determined whether there are no additional FF cells at step 1201. If it is determined at step 1202 that there are no additional FF cells, then the procedure is terminated ...
PROOFS: A fast, memory-efficient sequential circuit fault simulator - NIERMANN, CHENG, et al. - 1992 () Citation Context ... Fig. 5. The ATPG system amounts to about 1,000 lines of C code that interact with an in-house developed Fault Simulator (about 3,000 lines of code) based on...
A two phase compaction scheme is proposed to further improve the compaction level achieved by the restoration based compaction.; Based on fast static compaction techniques, a new property based ATPG system for synchronous sequential circuits is developed. It uses fast static compaction, test sequence ...