Test data volume and power consumption for scan vectors are two major problems in system-on-a-chip testing. Since static compaction of scan vectors invariably leads to higher power for scan testing, the conflicting goals of low-power scan testing and reduced test data volume appear to be irreco...
A DFT-based approach for reducing circuit switching activity during scan shift is proposed. Instead of inserting additional logic at the gate level that may introduce additional delay on critical paths, the proposed method modifies the design at the register transfer level (RTL) and uses the ...
The study design was a prospective non randomized trial.Data was analyzed by using SPSS (Statistical package for social sciences) version 17:0.Observation: Traumatic Brain Injury is more common in the younger age group. In our study acute(Subdural Hematoma) SDH was the most common CT scan ...