The equipment under test (EUT) is shown in green. It is placed on top of a 0.5mm thick insulator which rests on top of a table that has a horizontal coupling plane (HCP) of size 1.6 x 0.8 m2. The HCP is connected to the ground plane (GNP) below the table (0.8 m) through two...
A device passes a stress test condition level if all devices in the sample group stressed at that test condition level and below pass. All the devices and sample groups used must pass the measurement requirements specified in Section 2.2 and the failure criteria requirements specified in Section 2...
Can I use the circuits for PSpice simulations and real test setups or is something missing? Yes, it is a simplified but functional schematic. Real schematic is more complex with serial inductors. Is the track on the PCB from the ESD source to the ESD protection device rated for the ESD ...
Can I use the circuits for PSpice simulations and real test setups or is something missing? Yes, it is a simplified but functional schematic. Real schematic is more complex with serial inductors. Is the track on the PCB from the ESD source to the ESD protection device rated for the ESD m...
放电电流的典型波形放电电流的典型波形 typical waveform of the discharge currentrange 测试等级的范围测试等级的范围 rang of test levels; 试验设备试验设备 test equipment; 测试配置测试配置 test setup; 测试步骤测试步骤 test procedure; 校准步骤校准步骤 calibration procedure; 静电放电的术语定义静电放电的术语...
—rangoftestlevels;►试验设备 –testequipment;►测试配置 –testsetup;►测试步骤 –testprocedure;►校准步骤–calibrationprocedure;精品文档 静电放电的术语(shùyǔ)定义 *静电放电：具有不同静电电位的物体互相靠近或直接接触引起的电荷转移—transferofelectricchargebetweenbodiesofdifferentelectrostaticpotentialin...
testsetup;►测试步骤 –testprocedure;►校准步骤 –calibrationprocedure;静电放电的术语定义 *静电放电：具有不同静电电位的物体互相靠近或直接接触引起的电荷转移 —transferofelectricchargebetweenbodiesofdifferentelectrostaticpotentialinproximityorthroughdirectcontact.*间接放电方法：对EUT附近的金属耦合板进行放电，模拟...
Rent or buy ESD simulators for IEC 61000-4-2, ISO 10605 and every other electrostatic immunity test standard. Popular models include the Teseq NSG 435, NSG 438 and Haefely ONYX.
首页 >> 美国ESDEMC专区 >> ES660 ESD And Latch-UP Test System ES660 ESD And Latch-UP Test SystemES660系列ESD和LU测试系统是先进的多引脚自动化测试设备,旨在满足现代半导体测试的严格要求。这种多功能设备旨在无缝支持人体模型(HBM)、机器模型(MM)和闩锁测试,为评估集成电路(IC)和电子元件的可靠性和稳健...
Figure 4. Diagram of ESD Test Setup The following is taken from Application Note AND8308/D − Interpretation of Datasheet Parameters for ESD Devices. systems such as cell phones or laptop computers it is not clearly defined in the spec how to specify a clamping voltage at the devi...