The need to resolve the electrical properties of confined structures (CNTs, quantum dots, nanorods, etc) is becoming increasingly important in the field of electronic and optoelectronic devices. Here we propose an approach based on amplitude modulated electrostatic force microscopy to obtain measurements...
electrical double-layer. According to Derjanguin, Landau, Verwey, and Overbeek's (DLVO) theory, the electrostatic force in the double layer is one of the two forces responsible for either attraction or repulsion between particles. The other one is van der Waals force as a result of ...
electrical potential still exists is known as theDebye length. The presence of ions around a charged surface leads to the dampening of the electrostatic force and therefore a decrease in the Debye length. The distance over which these electrostatic forces can influence bacterial adhesion or repulsion...
a Electrostatic force microscopy (EFM) measurements were performed using the EFM mode of the AFM (MultiMode, Nanoscope IV from Veeco). The samples were scanned using an Antimony doped Si cantilever tip coated with a thin Cr layer. Topographical measurements and electrical data were obtained by th...
Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films68.37.Ps73.25.+i81.05.Uw81.15.GhElectrostatic force microscopy (EFM) has been used to probe the conducting properties of the hydrogen-terminated (H-terminated) surface of CVD diamond films. Two ...
The effect of electrical charge on inhaled particles has been recognized for nearly a century10. The electrostatic force, also known as Coulomb’s law, influences aerosol deposition by two concurrent mechanisms11. (i) The first draws on electrostatic repulsion that arises between charged particles in...
2c). The average adhesion force is characterized as 23.21 nN (the insert in Supplementary Fig. 2c) after treatment, which provides notable adhesion to Ag NWs with improved conductivity of the flexible electrode under bending condition (Supplementary Fig. 2d). Ag NWs are etched with serrated ...
(Es) in this winding. If a load that can consume electrical power is connected as shown, then a secondary current (Is) flows through the load. In modern power transformers, practically all of the lines of force produced by the primary current, cut through the secondary winding; this ...
In In the gated region, however, the metallic gate screens the Coulombic restoring force, which has the effect of reducing the acceleration of electrons driven by the exciting THz electric field. The plasmons in this rmεeefgif t (itokivn)ititynheotrhfeeAfoglrGaetaehAdasvreeagnaidomnGui...
Atomic force microscopy.Surface topography was imaged with a Bruker Dimension atomic force microscope. All images were obtained in air at room temperature and using silicon nitride cantilevers (TESPA-Bruker AFM probes, with spring constant of 20 N m–1). The scan area was set to between ...