We call this field force the electric, orelectrostaticfield. 我们称这种力场为电场, 或静电场. 期刊摘选 AnElectrostaticForce Microscope ( EFM ) for testing surface charge distribution of a sample is described. 描述了一种用于检测样品表面电荷分布的静电力显微镜 ( EFM ). ...
Within the framework of nonrelativistic electrodynamics, general formulas have been obtained for the tangential dissipative force of electrostatic friction and the normal force of attraction to the surface of an axially symmetric probe moving parallel to the smooth surface of homogeneous materials or ...
aThe short-range electrostatic force is divided into two separate terms. represents the interaction between the microscopic tip apex (which acts as a capacitor with the sample surface) and the sample counter electrode. represents the force between the mesoscopic tip apex with the surface charge densi...
We present a numerical and analytical study of the behavior of both electrostatic force and force gradient created by a charge trapped below the surface of a dielectric on an atomic force microscope tip as a function of the dielectric constant and tip-sample distance. As expected, the force dec...
way how to attribute partial relative distortions to each force component, for example, to determine the lateral electrostatic force fieldFelcomponent only from the high-resolution images. However, under certain assumptions and/or with the help of numerical simulations this problem can be circumvented...
Magnetic force microscopy Magnetic force microscopy (MFM) is a particular scanning probe microscopy (SPM) technique, which allows one to detect tip-sample magnetostatic interaction forces and to image them on the sample surface. This is obtained using an atomic force microscopy (AFM) setup equipped...
PROBLEM TO BE SOLVED: To raise electrostatic attracting force, hardly leave residual attracting force, and enable an object to be attracted to be detached, by making the rate of opening parts against the area occupied by a wire netting e... 大江 純司 被引量: 0发表: 2001年 Coloring of an...
and fixes the object to be adsorbed by a coulomb force, etc. working therebetween. On the other hand, when an electrostatic chuck is adopted as a sample holding mechanism for an electron microscope, etc., a strong electric field formed between a sample and the electrostatic chuck may disturb...
Hyperspectral infrared near-field nanoimaging at various temperatures was performed using a commercial cryogenic s-SNOM platform cryo-neasSNOM from Neaspec/Attocube GmbH equipped with a nano-FTIR module. Briefly, s-SNOM is based on an atomic force microscope (AFM), operating in a tapping mode (fre...
On the basis of the calculated force constants, phonon dispersion curves were obtained with the PHONOPY package51. Ab initio molecular dynamics Finally, 3 × 3 supercells (more than 300 atoms) were used for AIMD simulations with the canonical ensemble, which were performed to consider the ...