electron density profileThis paper presents the development of an Artificial Neural Network electron density profiler based on electron density profiles collected from radio occultation (RO) measurements from LEO (Low Earth Orbit) satellites to improve the spatial and temporal modeling of ionospheric ...
(Electron Beam Profiler) 本设备主要用于电子束能量分布测试,进而可以控制电子束焊接质量。 软件: Windows 7操作系统 通过GPIB或以太网的远程接入和脚本控制 通过ODBC接口的数据库连接 测试数据通过ASCII形式输出 技术参数: 测试孔直径:20μm 最大可测电子束能量:30kW ...
Plasmaspheric electron density reconstruction based on the topside sounder model profiler. Acta Geophys. 58 (3), 1895-6572. http://dx.doi.org/10.2478/s11600-009-0051-4.Kutiev, I, P. Marinov, A. Belehaki, N. Jakowski, B. Reinisch, C. Mayer and I. Tsagouri, Plasmaspheric electron ...
aAlong with 3.0 edition Yangtze River electron route chart research and development use,Doppler profiler ADCP has been gradually applied,This article introduced briefly how ADCP on the 240KW surveying ship, the 326KW beacon vessel does carry on the equipment setup the design proposal,And through th...
electron density profileThis paper presents the development of an Artificial Neural Network electron density profiler based on electron density profiles collected from radio occultation (RO) measurements from LEO (Low Earth Orbit) satellites to improve the spatial and temporal modeling of ionospheric ...
R.M. Thurman-Keup, M.L. Alvarez, J. Fitzgerald et al, Instal- lation Status of the Electron Beam Profiler for the Fermilab Main Injector, in Proceedings of the 4rd International Beam Instrumentation Conference(IBIC), p.535R. Thurman-Keup et al., "Installation status of the electron ...
Electron beam profiler solves weld focus problems. (Testing/Analysis).
Installation Status of the Electron Beam Profiler for the Fermilab Main Injectordoi:10.18429/JACOW-IBIC2015-TUPB077Randy Thurman-KeupMatthew AlvarezWillem BloklandJames FitzgeraldCarl LundbergPeter PrietoMatthew RobertsJames ZagelJACOW, Geneva, Switzerland4th International Beam Instrumentation Conference (IBIC...
Images are obtained of a first region and a second region of a subject material utilizing scanning electron microscopy (SEM). The SEM images are image processed to obtain a differential contrast between the first region and the second region. An image intensity variation is determined between ...
Images are obtained of a first region and a second region of a subject material utilizing scanning electron microscopy (SEM). The SEM images are image processed to obtain a differential contrast between the first region and the second region. An image intensity variation is determined between ...