x ray n. 1. X –radiation 伦琴射线,X射线辐射 2. X光照片 microanalyzer n. 微量分析仪 X rayunit 爱克斯光机 X raying 伦琴射线照射 x raying X射线透视,X射线照射 electron ray 【电】 电子射线 X rays 爱克斯光,爱克斯线 Probe v.盘问,追问,探究,(用细长工具)查看,探查 n.探究,详尽调...
必应词典为您提供electron-probe-X-ray-microanalyzer的释义,网络释义: 电子探针X射线微区分析仪;以电子束显微分析仪;电子微探仪;
G.: The TPD electron probe X-ray micro-analyzer. In: 5th Internat. Congress on X-ray Optics and Micro-Analysis, vol. 6, p. 261–268. Mollenstedt and K. H. Gaukler, eds. (1969)Fontijin, L.A., Bok, A.B., Kornet, J.G.: The TPD electron probe X-ray micro-analyzer. In: ...
3) electroprobe X ray microanalyzer 电子探针X射线分析仪4) X-ray electron probe microanalysis X射线电子探针显微分析 1. By means of environmental scanning electron microscopy and X-ray electron probe microanalysis,the relationships between relative content of P and those of Al,Cd and Pb in ...
Electron Probe X-Ray Analyzer (EPXA) Quantitative Analysis Software SODIGAM Gamma-Ray Analysis Software GAMMA-W Gamma-Ray Analysis Software for HPGe Detectors ORDERING INFO SOFTWARE+ DP5 Digital Pulse Processor Based Software+ Software for DP5 based Devices DPPMCA Display & Acquisition Software DPP ...
Electron Probe Micro Micro-analyzer
Electron Probe X‐Ray Microanalyzer A 1–3 micron electron probe of simplified design has been constructed for x‐ray spectrochemical analysis of metallic and nonmetallic specimens. At operat... LS Birks,EJ Brooks - 《Review of Scientific Instruments》 被引量: 33发表: 1957年 Application of ...
electron probe X ray microanalysis 【化】 电子探针X射线微量分析 electron probe 电子探针,电子微探针 electro probe X ray microanalysis 电子探针X射线显微分析仪 electron probe micrograph 电子探针显微照片 electron probe microanalyzer 电子探针显微分析仪 electron probe microanalyser 电子探针微区分析仪 ...
JEOL is the only manufacturer in the world who can propose the soft X-ray spectrometer. Products EPMA EPMA Options EPMA JXA-iHP200F Field Emission Electron Probe Microanalyzer (FE-EPMA) JXA-iSP100 Electron Probe Microanalyzer (EPMA) EPMA Options ...
~1998!. Wide area mapping of uneven specimens in an electron probe X-ray microanalyzer with wavelength dispersive spectrometers. J Electron Microsc 47, 39-46.Hideyuki Takahashi,Toyohiko Okumura.Wide area mapping of Uneven specimens in an electron probe xray microanalyser with wavelength dispersive ...