needs. We offer a range of versatile tools — everything from our easy-to-use desktop instruments such as theThermo Scientific Phenom Desktop Scanning Electron Microscopeto powerhouse instruments capable of unparalleled resolution and contrast like theThermo Scientific Verios Scanning Electron Microscope. ...
Microscope-embedded solution for single particle acquisition Optimized for high-throughput particle collection, providing real-time image analysis Includes components for scheduling, data acquisition, and decision algorithms View product Download datasheet Embedded CryoSPARC Live Real-time, multidimensional feedba...
Field-Emission Environmental Scanning Electron Microscope 型号:美国FEI Quattro S 功能:用于材料表面、断面形貌观察,微区成分定性定量分析。 技术参数: ﹡分辨率:1.0nm(30KV, SE) ﹡附件:X射线能谱仪(EDS)、电子背散射衍射仪(EBSD) ﹡放大倍数:300万倍 Model: FEI Quattro S Function: Used for observation of...
A method and calibration standard for fabricating on a single substrate a series of crystalline pairs such that the d-spacing difference between the pairs will generate Moire fringes of the correct spacings to optimally calibrate the magnification settings of an electron microscope over a variety of ...
AScanning Electron Microscope(SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. The high-resolution, three-dimensional images produced by SEMs provide topographical, morphological and compositional information makes them invaluable in a variety of science...
Focuses time on the microscope for higher throughput Download datasheet AutoTEM 5 Software Fully automatedin situS/TEM sample preparation Support of top-down, planar and inverted geometry Highly configurable workflow Easy to use, intuitive user interface ...
In an ordinary microscope, the glass lenses bend (or refract) the light beams passing through them to produce magnification. In an electron microscope, the coils bend the electron beams the same way. The image is formed as a photograph (called an electron micrograph) or as an image on a ...
The emitted electrons are accelerated in the strong electric field between the sample and the first microscope lens (∼104 V mm−1), and are then imaged with magnification by electron optics, consisting of typically 2–4 electrostatic or magnetic lenses. A back focal plane aperture limits ...
on a fine metal mesh. Each such ‘grid’, equivalent to a light-microscope slide, is held in a specimen-holder that is transferred to the stage. This moves the grid within the microscope, under operator control, and it must be very stable to avoid image blurring at high magnifications. ...
needs. We offer a range of versatile tools — everything from our easy-to-use desktop instruments such as theThermo Scientific Phenom Desktop Scanning Electron Microscopeto powerhouse instruments capable of unparalleled resolution and contrast like theThermo Scientific Verios Scanning Electron Microscope. ...