This Letter presents the validation of a model of electromigration, that is able to simulate nanogap formation by Electromigration Induced Break Junction (EIBJ). To this purpose, a novel validation method was introduced, which is based on the estimation of the deepening atomic flux from a ...
This Letter presents the validation of a model of electromigration, that is able to simulate nanogap formation by Electromigration Induced Break Junction (EIBJ). To this purpose, a novel validation method was introduced, which is based on the estimation of the deepening atomic flux from a ...
We fabricate nanogaps in gold wires by Electromigration Induced Break Junction. We validate a model of electromigration by analysing the fabrication R–V curves. The model simulates nanogap formation and predicts main electro-thermal parameters. We explain the advantages of this validation method ...
Break junctionElectromigrationSingle molecule junctionWe have investigated the electromigration process at gold nanojunctions by introducing a novel spectroscopic approach. When the junction voltage exceeded certain critical values, conductance showed successive drops by one quantum conductance, corresponding to ...