A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a first pin end anchored to a substrate. At least ...
The bottom face of the probe pin is connected directly to an electrode ( 7, 37 ) positioned in or on a print wiring board. A number of probe pins can be connected to the associated electrodes at a high density, thereby forming a fine-pitch probe card having a superior high-frequency ...
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The opposite face of the connector contains a plurality of apertures so that an electrical probe can have easy access to its interconnecting and isolating pins. The test connector includes two subassemblies, the first of which is comprised of an insulated body containing pin structures similar to ...
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and other factors. This uses a flying sensor. This comprises a variety of sensors and drivers that move freely over the board to carry out the measurements that need for the test. By applying the very same test method to PCBs with varied layouts, the software that controls the probe may ...
Test at the ‘PHY Si’ test point by using a measured S-parameter file to de-embed back to the transmitter pins Select TP2 and connector type to test at the device connector Select TP4_EQ to embed the standard’s cable model and apply equalization Use the WavePulser 40iX to create S-...
BACKGROUND OF THE INVENTION In the automatic testing of electrical circuits, test probes of various configurations are used, depending upon such factors as the type of electrical device under test, the spacing between test points, and the like. One type of prior art test probe includes a movabl...