// specify the chunk and local size of Dual Chunk Attention "local_size": 2048, "original_max_position_embeddings": 32768 // used for YARN in Dual Chunk Attention } }
ATTENTIONDetecting defects of yarn-dyed fabrics automatically in industrial scenarios can improve economic efficiency, but the scarcity of defect samples makes the task more challenging in the customised and small-batch production scenario. At present, most reconstruction-based methods have high ...