DFT team完成DFT logic的RTL level insertion (比如JTAG/ieee1500, mbist, SCAN相关的compress/decompress/等等)接着，PD team会对此时的design开始综合。综合完毕后，DFT team进行scan insertion在#2-#3的过程中，要对各种unit进行验证在tapeout后，产生p
Ozev, S., & Orailoglu, A. (2004).End-to-end testability analysis and DfT insertion for mixed-signal paths. InProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2004(pp. 72-77). (Proceedings - IEEE International Conference on Computer ...
[3]. C.-C. Lin, M. Marek-Sadowska, K.-T.Cheng, and M. Lee, “Test point insertion: scan paths through combinational logic,”Proc. of Design Automation Conf., 1996, pp. 268-273. [4]. Joep Aerts, Erik JanMarinissen: Scan chain design for test time reduction in core-based ICs.I...
Excellent analytical skills in verification and validation of test patterns and logic on sophisticated VLSI designs. Good exposure to multi-functional areas including RTL & clocks design, STA, place-n-route and power, to ensure we are making the right trade-offs. Experience in silicon debug and ...
- Bachelor (with +2 years working experience) or MS degree in VLSI area 戈女士2周内活跃 Qualcomm·招聘HR 竞争力分析 加载中... 个人综合排名:在 人中排名第 一般良好优秀极好 BOSS 安全提示 BOSS直聘严禁用人单位和招聘者用户做出任何损害求职者合法权益的违法违规行为,包括但不限于扣押求职者证件、收取求...
曾供职英飞凌微电子,Intel资深DFT工程师,灿芯半导体DFT主任工程师,现任上海盈方微DFT部门主管,主要从事VLSI/SOC产品的DFT相关工作。Kevin是国内第一批在专业芯片设计公司从事DFT设计的工程师,有10年以上DFT设计和验证的丰富经验,对DFT技术有深刻认识,实战经验丰富,完成了多款大规模量产基带芯片SOC的DFT设计。在加入盈方...
ATPG Hierarchy scan techniqueLogic BIST/SCAN Hybrid techniquePhysical aware scan insertion2.5D/3D TestIJTAG（IEEE 1687）Partial Good Test11、DFT Flow and tools. 芯片项目中的DFT 流程和工具DFT engineer 5 tasksDFT flow (top and block level)DFT flow inputs/outputs in each stepDFT tools (flow used...
Scan insertion. Partial scan, full scan. Scan assembly, chain balance, lockup latch placement. Dealing with the multiple phase clocks. Bottom up and top down test synthesis. How to deal with multiple types of scan cells. Test Synthesis rules. -- DRC rules: The Bridges To Success Clock rule...
2. Have experience in MBIST insertion. 3. Have experience in back-end design tool like ICC2/INN/ICC/PT. 4. Learned timing check and timing closure. 5. Familiar with the semiconductor process and foundry DRC rule deck.Applicants: Qualcomm is an equal opportunity employer. If you are an ind...
2010. DFT and minimum leakage pattern generation for static power reduction during test and burn-in. IEEE Transactions on VLSI Systems 18(3): 392-400.DFT and minimum leakage pattern generation for static power reduction during test and burn-in. Kao W C,Chuang W S...