第三,可重构性:通过可重构的设计方法,可以通过不同的配置,可是实现不同的测试功能,测试芯片的不同部分或功能。 参考文献 [1]. K.-T. Cheng and V. D. Agrawal, “An economical scan design for sequential logic test generation,” inProc. Fault-Tolerant Comput. Symp.(FTCS-19), June 1989, pp. 2...
The areas of analog circuit fault simulation and test generation have not achieved the same degree of success as their digital counterparts owing to the di... N Nagi,A Chatterjee,JA Abraham - Conference on Design Automation 被引量: 108发表: 1993年 An Investigation of an Arts Infusion Program...
Briefing Topics EDA Electrical Design Embedded IP PCB Expert Insights Latest Expert Insights Mastering the art of PCB routing Learn which routing techniques offer a PCB designer the best balance between automation and control by applying them in harmony. How AI improves DFT, test and yield ...
DAC 数字模拟转换器(Digital to Analog Converter) DFT 可测试性设计(Design for Testability) EEPROM 電子抹除式可複寫唯讀記憶體(Electrically Erasable Programmable Read Only Memory) FPGA 現場可编程逻辑閘阵列(Field Programmable Gate Array) IEEE 電機電子工程師學會(Institute of Electrical and Electronics Enginee...
Digital, 1998 C. M. Piguet, in VLSI Design Techniques for Analog and Digital Circuits, 2021 ...
Ideally, each new design will use the same connector type and signal layout so cables can be reused. These connectors should be ‘keyed’ to prevent misalignment. If the connector can be accidentally fitted in reverse, choose a pin layout that will prevent shorts between power pins and GND (...
VLSI Architecture for the Low-Computation Cycle and Power-Efficient Recursive DFT/IDFT Design(Digital Signal Processing) In this paper, we propose one low-computation cycle and power-efficient recursive discrete Fourier transform (DFT)/inverse DFT (IDFT) architecture adopting... V Lan-Da,CT Lin,YU...
Insert scan chains into a design using a top-down flow Specify and insert balanced top-level scan chains Specify and preview scan chain architectures Read and write Test Models in TestMAX DFT Control block-level scan chain length and clock domains to gi...
screen for the digital components. The evaluation process used to compare the effectiveness of these two test strategies shows that both approaches result in similar fault coverage figures and a number of simple circuit level design changes can enhance the fault coverage and reduce the size of the...
digital design is a must; 2. Experience in USB3/PCIE pcs design ; 3. Good knowledge of some general protocols or IPs: USB/PCIE , AMBA, I2C, uart, ARM; 4. Skilled in C,verilog and system Verilog language, vcs/nc verilog sim tool; 5. Relevant experience in USB3/PCIE controller or ...