在该测试中,为了全面评估待测ADC的性能,通常需确保在每个最低有效位(LSB)的区间内,至少有一个激励信号电压点。当每个LSB范围内激励信号电压点数只有1~2个时,可能仅可以确认增益误差(Gain Error)、失调误差(Offset Error)这样的宏观参数;LSB范围内点数足够多时,才能深入分析以确定转换编码的跳变电压点,从而算出其...
在该测试中,为了全面评估待测ADC的性能,通常需确保在每个最低有效位(LSB)的区间内,至少有一个激励信号电压点。当每个LSB范围内激励信号电压点数只有1~2个时,可能仅可以确认增益误差(Gain Error)、失调误差(Offset Error)这样的宏观参数;LSB范围内点数足够多时,才能深入分析以确定转换编码的跳变电压点,从而算出其...
This example shows how to find the offset and gain errors of a binary weighted DAC block. Open the modeldac_dc_error. The model consists of a Binary Weighted DAC block and a DAC Testbench. model ='dac_dc_error'; open_system(model) The parameters under theGeneraltab of the Binary Weigh...
Adjusting and Calibrating Out Offset and Gain Error in a Precision DACDavid Fry
Measure Offset and Gain Error of Binary Weighted DAC Find the offset and gain errors of a binary weighted DAC block. Measure AC Performance Metrics of Binary Weighted DAC Find the AC performance metrics such as SNR, SINAD, SFDR, ENOB, noise floor and settling time of a binary weighted DAC ...
INL, DNL , offset drift and gain drift of the DAC5681 is specified at the condition of over operating free-air temperature range.Will these parameters be improved at the narrow temperature range(for example +30°C~+40°C)?If yes, could I have the improved data...
To elaborate my question a bit more, I m trying to asses the maximum offset possible at code zero. By the datasheet this value is 0.001 % FSR, while the gain error by datasheet is 2 % FSR. In this case, without initially compensating/calibrating for co...
–Offset and Gain Errors –Absolute Accuracy –Relative Accuracy –Integral Nonlinearity (INL) –Differential Nonlinearity (DNL) –Monotonicity (DAC) –Missing Codes (ADC) –Low-f Spurious Free Dynamic Range (SFDR) –Low-f Total Harmonic Distortion (THD) –Effective Number of Bits (ENOB) –Power...
Integral Nonlinearity: Integral nonlinearity measures the maximum deviation between the ideal output of a DAC and the actual output after gain and offset errors have been removed. The switches used in series with the R-2R network can affect the INL. Multiplying DACs generally employ NMOS switches...
Total Unadjusted Error (TUE): The offset and gain errors are the biggest contributor to the TUE. The linearity is dominated by the choice of precision DACs. In most cases the linearity error from the DAC is negligible compared to the offset and gain errors. The offset error of the system ...