An algorithm for the same is proposed and the temperature rise of each core is monitored. It is also compared with the temperature rise of cores in case of scheduled testing and a good improvement is noticed. It is also compared with standard work. The simulation is done on HotSpot-6.02 ...
In: Proceedings of the FCTRU Goel P (1981) An implicit enumeration algorithm to generate tests for combinational logic circuits. IEEE Trans Comput C-30(3): 215 Article MATH Google Scholar Hsieh ER, Rasmussen RA, Vidunas LJ, Davis WT Delay test generation. In: Proceedings of the 14th ...
Gavril, F.: Some NP-complete problems on graphs. In: 11th conference on information sciences and systems, pp. 91–95 (1977) Google Scholar Thilikos, D., Serna, M., Bodlaender, H.: A Polynomial Algorithm for the cutwidth of bounded degree graphs with small treewidth. In: Meyer auf de...
An Improved VLSI Architectural Design of Discrete Cosine Transform Based on the Loeffler-DCT Algorithm The Discrete Cosine Transform (DCT) is a basic transform block used in Adaptive Multicore Transform (AMT), which is a core of High Efficiency Video Coding ... S Shirakol,SS Kerur - 《Intern...
The processor is responsive to system condition inputs for establishing different parameters of the control signal in accordance with a voltage regulation algorithm. In performing the voltage regulation function, the processor executes multiple sets of instructions corresponding to multiple feedback controls...
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An area-efficient flip-flop triggered by a dual-edge implicit pulse has been successfully developed by researchers using MOSFETs, reducing the power consumption by improving clock gating using a modified particle swarm optimization (MPSO) algorithm and decreasing the delay time via tristate inverters ...
**a.** Consider the recursive binary search algorithm for finding a number in a sorted array (see Exercise 2.3-5). Give recurrences for the worst-case running times of binary search when arrays are passed using each of the three methods above, and give good upper bounds on the solutions ...
Very-large-scale integration (VLSI) testing encompasses all spectrums of test methods and structures embedded in a system-on-chip (SOC) to ensure the quality of manufactured devices during manufacturing test. The test methods typically include fault simulation and test generation, so that quality te...
Jan. 2007VLSI Design '073 Motivation Present trends in semiconductor technology: Shrinking device dimensions. Leakage power is a dominant contributor to the total power consumption. Large variations in process parameters can cause a significant increase in leakage current because of an exponential relation...