Dziomba, T., Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L. & Danzebrink, H.U. (1999) Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM). Surf. Interface Anal. 27, 486 -4...
(1999) Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM). Surf. Interface Anal. 27, 486 -490.Dziomba, TH. , Sulzbach, TH. , Ohlsson, O. , Lehrer, CH. , Frey, L. , Danzebri...
The inter-pulse delay between the individual cross-polarized pulses of each sequence was systematically varied in the sub-ps range and the resulting LIPSS morphologies were characterized by scanning electron microscopy. It is found that the polarization of the first laser pulse arriving to the ...
(e) H&E stained histology image and (f) polarized light microscopy image of the histology slide. It can be seen from Figure 3 that the depolarization ratio of the epithelial layer (EP) is very low as compared to the lamina propria (LP). Similar results were obtained when the histology...