(e, f) Cr3Te4纳米片的XPS和XRD谱图。 Cr3Te4可被视为50%的Cr原子插入CrTe2层,形成非层状结构,其中单个晶胞的厚度为0.6 nm(图1 a, b)。通过CVD的方法,使用CrCl3和Te作为前驱体,Ar/H2为载气,670℃的温度下在硅片基底上生长了超薄的Cr3Te4纳米片(图1c)。通过改变不同的合成温度,可以有效调控生长的Cr...
此外,预嵌入后位于层间的Cr3+与钒氧化物层板中带负电荷的[VO6]基团之间形成的Cr-O键有利于保持其正极结构的稳定性。最后本研究通过ex-situ XRD,HRTEM,XPS等方法表征了Cr-VOH正极材料的储锌机理,证实了锌离子在其中的可逆脱嵌(图1)...
利用X射线光电子能谱（XPS）、二次离子质谱（SIMS）以及原位高温显微技术，可以对合金表面氧化层的形成、厚度和均匀性进行实时监测，从而揭示环境对合金物性参数的调控机制。基于这些研究，进一步开发涂层、激光清洗及化学酸洗等表面保护工艺，将有效降低环境因素对材料性能的负面影响，提升合金在实际复杂工况下的长期稳定性。
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SR2 to PDF SVG to PDF TCR to PDF TEX to PDF TGA to PDF TIFF to PDF TXT to PDF VSD to PDF VSDX to PDF WAV to PDF WBMP to PDF WEBP to PDF WKS to PDF WMA to PDF WMF to PDF WPD to PDF WPS to PDF X3F to PDF XCF to PDF XLR to PDF XLS to PDF XLSX to PDF XPS to PDF...
X-ray photoelectron spectra (XPS, Kratos Axis Ultra DLD, Shimadzu, Kyoto, Japan) were measured by the physical electronics 5600 multi-technique system. Achromatic 150 W Al Kα X-rays were chosen as the excitation source. The resolution was 0.05 eV. Diffuse reflection spectra were obtained ...
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FWIW: Although we don't shoot cRaw, out of curiosity, I just batched 10 CR3's from our R6 mark II with DPP 4 - 4.17.10 on a Dell XPS 17 running Windows 10 Pro and it took 2' 50". My laptop has an Intel i7 10th gen 6 core CPU running at 2.6GHz, a ...
(≈9.845 GHz) and a microwave power of 0.63 mW. XPS was performed on a Kratos Axis Ultra DLD. IQEs and EQEs were recorded by an Otsuka Photal Electronics QE-2100. A field-emission scanning electron microscope (FE-SEM, Hitachi S-4800) equipped with an energy dispersive X-ray ...