A scanning electron microscope (SEM) is a powerful scientific instrument used for high-resolution imaging and surface elemental analysis. They work by scanning a focused beam of electrons across the sample’s surface and detecting the resulting signals to create detailed images. SEMs provide value ...
The price of anElectron Microscope(EM) varies dramatically. According to the type, configuration, components, resolution, and other important factors, instruments can cost $75,000 - $10,000,000. New Scanning Electron Microscopes (SEM) can cost $70,000 to $1,000,000, while used instruments c...
The analysis of plant cell structure provides valuable information about its morphological, physiological, and biochemical characteristics. Nowadays, scanning electron microscope (SEM) is widely used to provide high-resolution images at the surface of biological samples. However, biological specimens require...
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Scanning electron microscopy (SEM) analyses and energy-dispersive X-ray spectroscopy (EDS) elemental mappings were performed on a Zeiss Merlin field-emission scanning electron microscope at an accelerating voltage of 20.0 kV. Transmission electron microscopy (TEM) imaging were carried out using a ...
Scanning electron microscope observations on the structure of portal veins, sinusoids and central veins in rat liver. Scan Electron Microsc 1983(Pt 3):1441–52.Search in Google Scholar PubMed [19] Betzig E, Patterson GH, Sougrat R, et al. Imaging intracellular fluorescent proteins at ...
A UV-Vis spectrophotometer (JASSCO V-630) was used to analyze the optical absorption spectra of the samples. A scanning electron microscope (JSM-651OLV) was employed to examine the samples’ morphology. The PL spectrophotometer (He-Cd laser, 325 nm, Max. 200 mW, and a Synapse CCD camera...
Corrosion behavior of Mg-5Y-1.5Nd alloy was investigated after heat treatment. The microstructure and precipitation were studied by scanning electron microscope (SEM) and energy dispersive spectrometer (EDS). The weight loss rates of different samples were arranged as T6-24 h > T6-6 h > T6-14...
The representative scanning electron microscopy (SEM) images in Fig.2eshow cross-sectional views of the CNT/PDMS film. Compared to previous reports, the micrographs indicate excellent dispersion quality, especially for a nanocomposite containing more than 4-wt% CNTs37. As expected, the CNT nanofille...
Scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (SEM/EDX). SEM images were obtained by a Zeiss Evo LS 15 scanning electron microscope by analyzing the samples under ultra-high vacuum with an accelerating voltage of 10 kV and working distances of 6.0–8.5 mm...