Differential structureIn this paper, we apply the common centroid layout technique in a differential latch structure (i.e., Quatro) and evaluate its effectiveness in reducing single event upset vulnerability. S
Common_Centroid Basic Differential Pair Layout active poly G1 Q 1 30/1 Q 2 30/1 D2 D1 S G2 Good matching in the absence of cross-chip gradients; both drain currents flow in same direction. Alternative Differential Pair Layout active poly G1 Q 1 30/1 Q 2 30/1 D2 D1 S G2...
AlternativeDifferentialPairLayout active poly G1 Q 1 30/1 Q 2 30/1 D2D1 S G2 D1 D2 S G1 G2 Morecompact,butworsematchingthanpreviouscase;draincurrentsflowinopposite directions. CommonCentroidLayout active poly G1 Q 1 15/1 M=2 Q 2 15/1 M=2 D2D1 S G2 G1 D1 S G2 D2 S G2...
However, since Ccm is large (0.5 pF), good matching (<0.1%) between Ccm can be achieved by using common-centroid layout techniques. Any residual mismatches in Ccm would indeed convert a common-mode signal at the electrode into a differential signal flowing out of the CMC path. However, ...
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Common_Centroid Basic Differential Pair Layout D1 Q1 30/1 D2 Q2 30/1 G1 G2 active poly D1 S S G1 D2 S G2 Good matching in the absence of cross-chip gradients; both drain currents flow in same direction. Alternative Differential Pair Layout D1 Q1 30/1 D2 Q2 30/1 G1 G2 act...