Fault Modeling of Combinational and Sequential Circuits at Register Transfer LevelAutomatic test pattern generation (ATPGfault coveragefault simulationstuck-at faultRTLAs the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tougher. As of now fault models are ...
and Computer Science Case Western Reserve University Cleveland OH USASpringer USJournal of Electronic TestingF. Kocan and D. G. Saab, "Dynamic fault diagnosis of combinational and sequential circuits on reconfigurable hardware," Journal of Electronic Testing: Theory and Ap- plications, vol. 23, no...
High pace, low strength, and countless staying energy are crucial houses of magnetic tunnel junction (MTJ), a spintronic tool, which assures its use in recollections and exact judgment circuits. This paper affords a PentaMTJ-based totally logic gate, which affords easy cascading, self-referencing...
combinationalpoweranalyticalcircuitssequentiallevel AnalyticalModelforHighLevelPowerModelingofCombinationalandSequentialCircuits†SubodhGuptaandFaridN.NajmECEDept.andCoordinatedScienceLab.UniversityofIllinoisatUrbana-ChampaignUrbana,Illinois61801AbstractInthispaper,weproposeamodelingapproachthatcapturesthedependenceofthepowerdis...
Real-world digital circuits consist of combinations of combinational and sequential sub-circuits, connected and configured in a hierarchy. Having examined the behavior of some of these sub-circuits (both combinational and sequential) in detail earlier, we now examine their hierarchical combinations, as...
1. 组合电路 類比电路(Analog Circuits)组合电路(Combinational Circuits) 线性电路(Linear Circuits) 序向电路(Sequential Circuits) 20KΩ V ... www.docin.com|基于16个网页 2. 组合逻辑电路 测试/组合逻辑电路,test/combinati... ... ) combinational logic circuits 组合逻辑电路 )combinational circuits组合...
Sequential Logic (有存储状态,可以认为比如寄存器之类的) 布尔代数 熟悉布尔代数在设计逻辑电路的时候可以帮助我们更好的思考。一些常用的公里和定律,不列举了。不同的布尔表达式虽然在输出结果上是一致的,但是会映射到不同的逻辑门实现上。 上面这个例子,如果用布尔表达式进行一些合并,最后的逻辑门组合就会不一样,可能...
A compositional approach to the combination of combinational and sequential equivalence checking of circuits without known reset states As the pressure to produce smaller and faster designs increases, the need for formal verification of sequential transformations increases proportionally. I... IH Moon,P ...
This paper presents a method for the optimal synthesis of combinational and sequential circuits implemented by two-level logic macros, such as programmable... GD Micheli - Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on 被引量: 184发表: 1986年 Fundamentals of Digital...
Low power test is taking center stage for both combinational and sequential circuits in recent years due to its impact on overall yield. This paper proposes a technique that targets the reduction of peak current during combinational circuit test to realize peak power reduction. Unlike previous ...