MHU300 wafer loader for two independent prober systems to share a single handling unit, enabling greater test cell efficiency and minimizing footprint The CM300xi probe system offers measurement accuracy and reliability in a solution that is completely modular – whether it’s I-V/C-V, RTN ...
Finally, the CM300xi-ULN takes the complexity out of low noise TestCell optimization. Just plug it in and go. TestCell Power Management eliminates all ground-loop induced TestCell noise and provides fully managed and filtered AC power to the entire system, prober and instruments. ...
自动库存和盒式热插拔功能,用于高优先级晶圆测试处理 Prober可以在现场使用MHU晶圆装载机进行升级 紧凑型MHU301晶圆装载机,占地面积最小 MHU300晶圆装载机,用于两个独立的探针系统,可共用一个处理单元,从而提高测试电池效率并最大限度地减少占地面积 CM300xi探头系统在完全模块化的解决方案中提供测量精度和可靠性 – 无...
This provides the critical probing environment built into the prober and directly surrounding the DUT and wafer chuck area for low noise testing. The newly enhanced ULN MicroChamber ensures a complete EMI /RFI shielded area, like a small, localized version of a large lab-sized Faraday cage. In...