...Tong-Chern Ong, Koichi Seki, Ping K. Ko and Chenming Hu...
p-MOSFET gate current and device degradation: Tong-Chern Ong, Koichi Seki, Ping K. Ko and Chenming Hu.27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp. 178 (1989) - ScienceDirecthafnium compoundshigh-k dielectric thin filmsleakage currents...