A system and method for efficiently performing timing characterization of regions of an integrated circuit. An integrated circuit has monitors distributed in different physical regions across its die. Each monitor includes timing characterization and self-test circuitry. This circuitry includes one or more...
The concept of pseudo-faults is introduced and applied to the general testing model to characterize Type I error which occurs when a good circuit fails the test. Pseudo-faults are seen to affect circuits randomly and occur independently of other defects due to the interaction between the test ...
An interlevel conductor defect characterization integrated circuit test structure including first and second spaced test pads, a conductor layer, an insulator layer between the conductor layer and the test pads; and a first interlevel conductor having a unit cross-sectional conductive area extending bet...
Characterization involves measurement of setup time, hold time and pulse width of the signals.In this paper, we have presented an automated AC (timing) characterization flow for digital circuit testing. We have recommended a STIL (Standard Tester Interface Langauge) like syntax for the timing ...
United States Patent US5787092 Note: If you have problems viewing the PDF, please make sure you have the latest version ofAdobe Acrobat. Back to full text
The input is batches of newly manufactured integrated circuit parts subjected to characterization sampling and the output is a data set. The result is to prove or disprove that the devices can and will continue to perform their targeted functions according to the product definition. Data resulted ...
They provided us only a bank's informations. 我们付钱给其他客户?他们向我们提供 仅仅一家银行的信息。 [translate] a10.9 Test, characterization and integration of circuit model 10.9 测试、电路模型的描述特性和综合化 [translate] 英语翻译 日语翻译 韩语翻译 德语翻译 法语翻译 俄语翻译 阿拉伯语翻译 西班牙...
Hspice results show that the power density of each 7nm FinFET circuit is at least 10 to 20 times larger than that of the same 45nm CMOS circuit in near- and super-threshold voltage regimes. Also the power densities of FinFET circuits are shown to be much higher than the limit of air ...
A non-destructive test structure for printed circuit board characterization and method of testing the same are disclosed. In one form, a method for testing a printed circuit board can include applying a test signal to a first test location of a first test structure associated with a first inner...
The electrical performance of HgCdTe/Si photodiodes is shown not to have a direct relationship with the dislocation density as revealed by defect etching. This has led to an equivalent circuit model to explain the relationship of the dislocation density and the electrical test data. A new (112)...