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网络预烧测试 网络释义 1. 预烧测试 瑞萨将预烧测试(Burn-In Testing)机台从神奈川县玉川事业所大老远送往九州川尻工场;与此同时,东芝正展开功率半导体元件 … www.solarf.net|基于5个网页
Burn-in testing is the process by which a system detects early failures in semiconductor components (infant mortality), thereby increasing a semiconductor component reliability. Normally burn-in tests are performed on electronic devices such as laser diodes with an Automatic Test Equipment laser diode ...
Burn-inis the process by which components of a system are exercised prior to being placed in service (and often, prior to the system being completely assembled from those components). This testing process will force certain failures to occur under supervised conditions so an understanding of load...
A common approach used to weed out defective and weak parts before shipping the products to customers is burn-in testing. Burn-in testing has become a frequently used procedure in many industries, especially the semiconductor industry. In this article, an overview of burn-in testing is presented...
Burn-In is the application of thermal and electrical stress to induce the failure of devices that have inherent defects not detected by other testing procedures. Based on decades of experience in reliability testing, STS offers a high-quality, cost-effective approach to burn-in for high-power de...
Integrated with environmental chamber for accelerated life testing Modular software with graphical interface Results can be stored in database for analysis and reporting Reduces cost of burn-in test while optimizing throughput Request more information and Keysight’s partner,LXinstruments, will contact you...
Burn-in testing strategies are devised based on the objectives of the test, such as the time required for the test to last and which components to focus on. One of the major objectives of burn-in testing is to eliminate failures in the initial high-failure rate portion in the bathtub curv...
(and often, before the system being completely assembled from those components). This testing ...
Burn-in testing places devices in high stress environment. The stress conditions that are applied to devices during burn-in are an effective method of aging the devices. In particular, burn-in testing is used to check for internal metal migration or metal expansion that can effect device operati...