Built-In-Test) AcronymDefinition BIT(E) Built-In-Test (Equipment) Copyright 1988-2018 AcronymFinder.com, All rights reserved. Suggest new definitionWant to thank TFD for its existence? Tell a friend about us, add a link to this page, or visit the webmaster's page for free fun content. ...
Design of BIT for an Electric Equipment; 某电子装备的机内测试系统设计 3. Based on the mechanism of the false alarm and built-in test (BIT) system information treating process, a model was established for calculating false alarm rate (FAR). 根据虚警产生的机理及机内测试(BIT)系统信息处理流...
2.Design of BIT for an Electric Equipment;某电子装备的机内测试系统设计 3.Based on the mechanism of the false alarm and built-in test (BIT) system information treating process, a model was established for calculating false alarm rate (FAR).根据虚警产生的机理及机内测试(BIT)系统信息处理流程对...
Define built-in-test (BIT). means : tests run at request, triggered by the operator or by an external equipment;
Artificial intelligence refers to computer systems capable of performing tasks that are typically thought to require human intelligence.
Consumers are becoming more knowledgeable, paying close attention to the source and type of beans, brewing methods, and equipment. They also appreciate the design of coffee machinery, not just for its functionality but for its aesthetics, efficiency, and space management. This surge in interest, ...
The ISO26262 standard defines functional safety for automotive equipment. A requirement of the standard is to detect the accumulation of latent defects. To meet this requirement the MPC5746R has the ability to execute Built-In Self-Test (BIST) procedures. The BIST is intended to identify latent...
This method has allowed researchers in all types of academic disciplines and commercial industries to figure out how things (equipment, viruses, etc.) would function or act in certain environments without having to physically replicate those conditions. In the case of Macal and his cohorts, that ...
Testing of signal integrity (SI) in current high-speed ICs, requires automatic test equipment test resources at the multigigahertz range, normally not available. Furthermore, for most internal nets of state-of-the-art ICs, external speed testing is not possible for the newest technologies. In ...
Test setup and loading procedure This test was carried out in the Laboratory of Xinjiang University. The low cycle reciprocating load test was utilized to evaluate the seismic performance of the specimens. The test equipment and boundary conditions are depicted in Fig.6. The geometry of the specim...