Built in self-test (BIST) is widely used in multiprocessor chips due to its high speed property compared to external testing. In addition, it is known that dynamic logic could award high speed to digital systems. However, high energy consumption has been always a limitation in this logic styl...
Verification of BIT capability by design analysis for verification purposes is not currently recognized as a reliable means of verification. Use of simulated set of faults has also proven to have low effectiveness for evaluation of BIT capabilities, as well as being costly. BIT on equipment in ...
1.Analysis and Design for Modularization of BIT System;机内测试系统模块化的分析与设计 2.Design of BIT for an Electric Equipment;某电子装备的机内测试系统设计 3.Based on the mechanism of the false alarm and built-in test (BIT) system information treating process, a model was established for ...
The built-in test has become an effective approach of improving testability.During the recent twenty years,it has gone ahead greatly from theories to applications.Its applications range from large military equipment to aeronautics and space system and extend to the civil large complex equipment.The ...
Built-in test (BIT) provides fault finding as a means to aid in system assembly, test, and maintenance. An investigation to evaluate BIT of a particular electronics board used in the in-flight entertainment system for Boeing 777s is described. We found BIT proved useful when failure occurrence...
A method is given for incorporating the effects of built-in test (BIT) into the life cycle cost of a given electronic system. A cost model is derived that captures the savings achieved by BIT through reducing the maintenance times, complexity of external test equipment, personnel skill levels,...
Test pixels revealed background limited ... KW Huang,M Razeghi - Proceedings of SPIE - The International Society for Optical Engineering 被引量: 8发表: 2012年 Analysis of Process-Geometry Modulations through 3D TCAD In this work we present a study of the combined effects of the variation of ...
Post layout simulations show that the proposed BIST circuit can be used to measure the stability parameter with high accuracy. In addition, the proposed BIST has very low overhead. 展开 关键词: Built-in self-test Correlators Circuit stability Stability analysis System-on-chip Computer architecture ...
网络机内测试 网络释义 1. 机内测试 机内测试(Built-in test,BIT)是系统或设备自身为故障检测、隔离或诊断提供的自动测试能力。 短句来源 The paper proposes isol… dict.cnki.net|基于20个网页 例句 释义: 全部,机内测试
. Extensions have been proposed that increase the on-chip complexity in lieu of faster overall test procedures[87]. Beyond production BIT and BIST, the principles of detection lies within the wider research area ofanomaly detection[88]. For example, at higher system levels cluster analysis is a...