高性能IconIR平台的可选方案,配备可放置300 mm样品的大样品台,是半导体研发、故障分析和纳米污染物识别的理想选择 阅读更多 Dimension IconIR 超高分辨率、单层灵敏度和样品灵活性的关联AFM和化学成像 阅读更多 Anasys nanoIR3 纳米红外光谱及成像系统 真实、准确的红外光谱,化学成像和物性成像,适用材料科科学及生命科学...
Dimension IconIR The leading-edge photothermal IR spectroscopy platform for advanced nanoscale, sub-micron, and macro scale applications Read More Innova-IRIS 原子力-拉曼显微镜联用系统 第一也是唯一一个完整的尖端增强拉曼光谱(TERS)解决方案。 阅读更多 ...
Bruker's nanoscale infrared (nanoIR) spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales. We are dedicated to delivering innovative products and solutions that measure spatially varying
布鲁克公司(Bruker)的大样品台纳米红外光谱(Dimension IconIR)平台,集成了基于峰值力轻敲模式的形貌、PeakForce QNM、PeakForce KPFM等电学、纳米力学测量、以及纳米红外成像(AFM-IR)等技术为天体化学、地球化学、地质岩石等纳米形貌、纳米力学性质、电学性质和纳米尺度化学成分和官能团的分布测量提供了强有...
Find Dimension Icon (AFM) offered at competitive prices and includes the Bruker quality standard and support. Shop now for Dimension Icon at Bruker, the worldwide leader in scanning probe microscope (SPM) and atomic force microscope (AFM) instrumentation
基于非常成功的Dimension Icon? AFM 构造,FastScan原子力显微镜是一个针尖扫描系统,能在常温空气中或液态中对大尺寸和小尺寸的样品进行测量。目前,运用 Dimension FastScan AFM系统,高性能、高分辨率,用户可以在一个系统里面即刻获 得原子力的图像。对样品研究,查找重点区域时,无论在125Hz时扫描,或者时间频率为1秒/...
Dimension FastScan Pro for High-Volume Production Environments Dimension Icon Atomic Force Microscope from Bruker Dimension IconIR - For Photothermal AFM-IR Dimension XR Scanning Probe Microscopes: Featuring AFM with nanoDMA Electrochemical Scanning Probe Microscopy: Increased Control for MultiMode AFMs ...
Dimension IconIR - For Photothermal AFM-IR Dimension XR Scanning Probe Microscopes: Featuring AFM with nanoDMA Electrochemical Scanning Probe Microscopy: Increased Control for MultiMode AFMs Enhanced Metrology Analysis and Reporting – Vision64 Map ...
品牌:布鲁克 Dimension Edge 扫描探针显微镜系统 品牌:布鲁克 Dimension Icon扫描探针显微系统 品牌:布鲁克 Dimension FastScan原子力显微镜 品牌:布鲁克 Bruker第八代多功能扫描探针显微镜 品牌:布鲁克 布鲁克BioScope Resolve生物型原子力显微镜 品牌:Anasys Anasys afm+ 原子力显微镜 分析...
Dimension FastScanTM原子力显微镜(Atomic Force Microscope,AFM),在不损失Dimension Icon 超高的分辨率和卓越的仪器性能前提下,大限度的提高了成像速度。这项突破性的技术创新,从根本上解决了AFM成像速度慢的难题,大大缩短了各技术水平的AFM用户获得数据的时间。 为满足AFM使用者对提高AFM使用效率的需求,Bruker开发了这...