《boundaryscan技术资料.doc,边界扫描(Boundary scan )是一项测试技术,是在传统的在线测试不在适应大规模,高集成电路测试的情况下而提出的,就是在IC设计的过程中在IC的内部逻辑和每个器件引脚间放置移位寄存器(shift register).每个移位寄存器叫做一个CELL。这些CELL准许
公开了一种具有边界扫描测试功能的管脚和包括该管脚的集成电路. It discloses a pin having a boundary scan testing function and the integrated circuit comprises a pin. 所述管脚包括至少一个边界扫描寄存器,边界扫描信号输入引脚,边界扫描信号输出引脚以及从TAP控制器接收边界扫描控制信号的TAP控制信号端. The ...
(Fig. 9.6). The BSCs are interconnected to form a shift register scan path between the host IC's test data input (TDI) pin and test data output (TDO) pin. During normal IC operation, input and output signals pass freely through each BSC. However, when the boundary-test mode is ...
A boundary-scan logic design method that depends only on level-sensitive scan design (LSSD) principles has been developed for IBM CMOS application-specific integrated circuit (ASIC) products. This technique permits comprehensive testing of LSSD ASICs with high signal input/output (I/O) pin counts,...
Boundary Register description: This description provides the structure of the Boundary Scan cells on the device. Each pin on a device may have up to three Boundary Scan cells, each cell consisting of a register and a latch. The Boundary Scan Description Language, BSDL, is widely used within ...
An estimate of the total size of the boundary scan register can be obtained by looking at the size of the boundary scan cell for an output pin illustrated in figure given below. A circuit that implements this design requires around 0.015 mm2. It can be expected that boundary scan cells for...
IEEE Design & TestClay S,Gloster.Boundary scan with built-in self-test. IEEE Design and Test of Computers . 1989Clay S G,Franc B.Boundary scan with... Clay S Gloster,F Brglez - 《IEEE Design & Test》 被引量: 60发表: 1989年 Design and implementation of a hierarchical testable architec...
In a preferred embodiment, the user views the frame cell number in the boundary scan chain, the device cell number within a device at that point of the chain, the device name, the pin of the device associated with the cell, the node associated with the pin, the predicted value for the...
Scanscan 系统标签: diagnosysscanboundarypinpointdevicesclocked OptionBoundaryScanisatesttechniquewhichenablesthetestingofdevicesthroughtheTestAccessPort(TAP).DevicesarespeciallydesignedtohavethiscapabilityandenableddevicesareoftenconnectedtogetherusingtheTAPtoformachain.BoundaryScanwasintroducedasawaytoovercometestabilityissue...
The boundary scan test data must be entered into the chip's core logic to test the chip. Basically, the test data must reach the same core logic elements as the operational data. Typically, a multiplexer is used to select operational or test data. In the past, such multiplexers have been...