Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp. 178, plus XI, ISBN 1-4020-7235-X, €107doi:10.1016/j.microrel.2003.12.010Mile StojcevElsevier LtdMicroelectronics Reliability...