一、Basic-Scan VS. Fast-Sequential Basic-Scan 全扫描,单捕获时钟脉冲 Fast-Sequential 数量有限的no-scan(非扫描触发器,latches,bus keepers,RAMs),可能有多个捕获时钟脉冲 二、降低AU fault,提高测试覆盖率 1、在basic scan后启动fast sequential 如果在Basic-Scan ATPG之后仍然存在AU故障,那么可启用fast sequent...
lnvestigate DRC rule violations report_faults analyze_faults 提高测试覆盖率的方法: 无需更改设计 增加abort limit——减少ND 启用快速顺序和全顺序ATPG——减少AU 创建TetraMAX memory模型——增加memory shadow logic测试覆盖率 消除一些Pl约束 (eg.异步reset上的Pl约束导致覆盖率降低) 使用analyst_faults 更改设计...
report_clocks -verbose lnvestigate DRC rule violations report_faults analyze_faults 提高测试覆盖率的方法: 无需更改设计 增加abort limit——减少ND 启用快速顺序和全顺序ATPG——减少AU 创建TetraMAX memory模型——增加memory shadow logic测试覆盖率 消除一些Pl约束 (eg.异步reset上的Pl约束导致覆盖率降低) 使用...
Troubleshoot DRC violations Troubleshoot areas of low test coverage Troubleshoot simulation mismatches Hands-on labs Accessing documentation and getting help Using the scan and ATPG tool flow Reading and analyzing messages Troubleshooting a DRC error in DFTVisualizer Using common methodologies to attain a...
TurboCheck RTL DRC Violations Yes No Logic Synthesis TurboCheck Gate Test Synthesis SynTest Company Confidential 17 Copyright ? 2000 SynTest Technologies, Inc. Boundary Scan Principles The Testability Company ? History and Motivation ? Boundary Scan Cell Configurations ? Boundary Scan Test Operations ?
. . . 189 Checking Rules and Debugging Rules Violations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 191 Running Good/Fault Simulation on Existing Patterns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...
i think u r problem is bcz of the violations present in the design after synthesis.make sure of those violations to be fixed before u run the simulation or plz run the simulations at no_delay mode of the nc verilog. bye rameshs Do u mean the violations present in TetraMax? But pre-...
DRC Violations Test Synthesis RTL testability analyzer The Testability Company Copyright © 2000 SynTest Technologies, Inc. 18 SynTest Company Confidential Boundary Scan Principles • History and Motivation • Boundary Scan Cell Configurations • Boundary Scan Test Operations • TAP Controller Architec...
Reviewing the DRC Results 4-19 See Also 4-20 Understanding Rule Violations 4-20 Viewing DRC Violations in the GSV 4-21 See Also 4-22 Preparing for ATPG 4-23 See Also 4-23 Specifying General ATPGSettings 4-23 Options for Specifying ATPGSettings 4-23 ...