ATP offers industrial grade wide-temp DRAM modules to ensure better endurance and redundancy in critical environments where commercial-grade DRAMs do not suffice. ATP’s Test During Burn-In (TDBI) can detect and screen out 0.01% error, and 100% major integrated circuits (ICs) are sourced from...
ATP offers industrial grade wide-temp DRAM modules to ensure better endurance and redundancy in critical environments where commercial-grade DRAMs do not suffice. ATP’s Test During Burn-In (TDBI) can detect and screen out 0.01% error, and 100% major integrated circuits (ICs) are sourced from...