ATP offers industrial grade wide-temp DRAM modules to ensure better endurance and redundancy in critical environments where commercial-grade DRAMs do not suffice. ATP’s Test During Burn-In (TDBI) can detect and screen out 0.01% error, and 100% major integrated circuits (ICs) are sourced from...
The NPS standard deviation (SD) in patients with grade 1 CIPN was 17. With 80 patients we will have 80% power to detect a difference between arms as small as 10 points on the NPS, assuming a one-sided test, type I error of 5%, correlation between baseline and follow-up measurements ...
ATP offers industrial grade wide-temp DRAM modules to ensure better endurance and redundancy in critical environments where commercial-grade DRAMs do not suffice. ATP’s Test During Burn-In (TDBI) can detect and screen out 0.01% error, and 100% major integrated circuits (ICs) are sourced from...