1. (b) The image obtained by statistically averaged over 200 b d different regions in FIG. 1. (c)B B' D D' Gaussian filtered image of (b). (d) Simulated image.Ryo IshikawaNaoya ShibataFumiyasu ObaTakashi TaniguchiScott D. Findlay...
In a typical application of ML to STEM images, an atomic-resolution image is segmented into multiple subimages ofn × mpixels2, which are flattened into vectors (that can each be thought of as the multidimensional coordinate of a data point) ofnm × 1 pixels2. These data points ...
A new method for precise determination of the Cc coefficient is demonstrated, requiring measurement of an atomic-resolution one-frame through-focal HAADF STEM image. This method is robust with respect to instrumental drift, sample thickness, all lens parameters except Cc, and experimental noise. It...
World's Leading Research Atomic Resolution Microscope! Since its introduction, the JEOL ARM (Atomic Resolution Microscope) TEM/STEM product line has become the chosen platform for atomic resolution imaging/analytical research. The ARM product line is at the leading edge of research in the spherical ...
M. Atom column indexing: atomic resolution image analysis through a matrix representation. Microsc. Microanal. 20, 1764–1771 (2014). CAS Google Scholar Kresse, G. & Hafner, J. Ab initio molecular dynamics of liquid metals. Phys. Rev. B 47, 558–561 (1993). CAS Google Scholar Kresse...
Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns an
Although scanning transmission electron microscopy (STEM) images of individual heavy atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging became wide spread only after the practical realization of aberration correctors on field-emission STEM/TEM instruments to form sub-ng...
The parallel collection of different signals from a variety of detectors can be used to form an image in series with bright field, annular dark field, and high-angle annular dark field with resolution down to the atomic scale. Figure 39. Schematic of a STEM equipped with an aberration ...
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be ... A De Backer,A De Wael,J Gonnissen,... - 《...
Fortunately, for atomic resolution imaging, our defect detection algorithm applies to both modes because the model learns the atomic arrangement rules with and without defects, which is unrelated to the imaging method. Thus, we only take the STEM mode as an example to construct a dataset of ...