FM-Nanoview 1000 Factory Manufacturer Afm Atomic Force Microscope US$25,000.00 1 Piece (MOQ) Laboratory Precision Analysis Atomic Force Microscope Price US$27,000.00-30,000.00 1 Piece (MOQ) FM-Nanoview Tapping Student Atomic Force Microscope US$25,000.00 1 Piece (M...
We provide atomic force microscope for normal physical education and wifer inspection. It is the best cost ratio AFM. Detailed Photos Why choose us? 1.Over many years' experience in production and service. 2.We are manufacturer who can give you Preferential price 3.ISO9001 certified....
Atomic Force Microscope Supplier, Measuring Microscope, Metallurgical Microscope Manufacturers/ Suppliers - Suzhou FlyingMan Precision Instruments Co., Ltd.
Here you can request the price for an atomic force microscope (AFM). We can help supply AFM for all budgets at various costs.
Atomic Force Microscope 型号:德国Bruker Dimension ICON 功能:用于表征材料表面形貌特征。 技术参数: ﹡XY方向扫描范围:90µm×90µm ﹡Z方向扫描范围:14µm ﹡具备多种成像模式,包括闭环模式、智能模式、接触模式、轻敲模式。 ﹡功能附件:磁力显微镜、侧向力显微镜、调频和高压开尔文探针显微镜。
Atomic Force Microscope (AFM) Test Service Atomic Force Microscope (AFM) Instrument Model NT-MDT Prima, Bruker Dimension Edge, Bruker Dimension ICON, Agilent 5500 Test Content Morphology, PFM, EFM, KPFM, MFMC-AFM
2、Bidding Content Bidding No:1009-2441HOLLY330 Project Name:Atomic Force Microscope Place of Implementation:Jiangsu Province, China List of Products: 3、Qualification Requirements For Bidder Qualifications or Performance:(1) The domestic bidder shall have the independent legal person status and business...
Use silicon wafers for your atomic force microscopy experiments. Silicon's flat, smooth surface offers excellent optical and electrical properties, making them ideal for AFM experiments.
原子力显微镜（Atomic Force Microscope，AFM）是一种用于研究表面形貌和表面物理特性的高分辨率扫描显微镜。它利用原子之间的相互作用力来探测样品表面的形貌和性质，具有极高的分辨率和灵敏度。原子力显微镜的基本原理是通过扫描探针与样品表面之间的相互作用力来获得表面形貌信息。当探针与样品表面接触时，会受到表面形貌起伏...
The AFM5500MⅡ, an Atomic Force Microscope is an AFM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples, affording exceptional levels of ease of use, automation, and accuracy, as well as correlation for AFM/SEM