Nuclear physics Application of X-Ray Diffraction to Material Analysis and Medical Imaging STATE UNIVERSITY OF NEW YORK AT ALBANY Carolyn A. MacDonald ZhouWeiPowder diffraction is commonly used to determine the structures of both inorganic and organic materials. The angle and intensity of the ...
Quantitative X-ray diffraction, normative calculation, and whole-rock chemical analysis have been compared for Permo-Triassic quartz-lithic to litho-feldsp... CR Ward,JC Taylor,DR Cohen - 《Journal of Sedimentary Research》 被引量: 73发表: 1999年 X-ray diffractometry and electron microscopy of ...
Theoretical Concepts of X-Ray Nanoscale Analysis in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All... A Benediktovitch,I Feranchuk,A Ulyanenkov - Theoretical Concepts of X-Ray Nanoscale Analys...
APPLICATION OF X-RAY DIFFRACTION TECHNIQUES TO THE SEMICONDUCTOR FIELDMunekawa, ShigeruMunekawa, S (1988) "Application of X-ray diffraction techniques to the semiconductor field", The Rigaku Journal, 5 (2), 31 - 34.Munekwa, S. Application of X-ray diffraction techniques to the semiconductor ...
中的应用 iterative blind deconvolution algorithm in the application of x-ray diffraction spectrum,迭代盲目反卷积算法在x射线衍射谱中的应用 iterative blind deconvolution algorithm in the application of x-ray diffraction spectrum,iterative,blind,deconvolution,algorithm,in,the,application,of,x-ray,diffraction...
In recent times it has proved to be an excellent method also for the study of phase transitions and the formation of (twin) domains.doi:10.1007/978-1-4615-5879-8_10Helmut KlapperSpringer USH. Klapper: X-ray diffraction topography: Application to crystal growth and plastic deformation. In: ...
X‐ray depth profiling in a grazing incidence asymmetric Bragg geometry is used to obtain the depth‐dependent structure of a nominally γ‐Fe2O3thin film,... MF Toney,S Brennan - 《Journal of Applied Physics》 被引量: 29发表: 1989年 Grazing incidence X-ray diffraction for the study of ...
TECHNIQUE FOR PROCESSING X-RAY DIFFRACTION DATA A computer-implemented method of processing X-ray diffraction data is provided, wherein the X-ray diffraction data is provided by an X-ray detector (1030) configured to detect diffracted X-ray beams (20) of a sample (30) to be investigat......
机译:非均匀晶体膜的动态X射线衍射:在X射线摇摆曲线分析中的应用 摘要 A dynamical model for the general case of Bragg x-ray diffraction from arbitrarily thick nonuniform crystalline films is presented. The model incorporates depth-dependent strain and a spherically symmetric Gaussian distribution of rando...
Day 1 (Jul 1, Mon) AM Introduction to powder X-ray diffraction and instrumentation Sample preparation DIFFRAC.COMMANDER PM DIFFRAC.EVA hands-on session Search/Match strategies for qualitative phase analysis Working with the COD and ICDD PDF database ...