The Young’s modulus of the Si substrate and Al film are presented by 𝐸𝑆𝑖ESi (GPa) and 𝐸𝑓Ef (GPa), respectively. 𝑡𝑆𝑖tSi (µm) is the thicknesses of the Si beam, while 𝑡𝑓tf (nm) represents the thickness of the Al film. The pressure parameters in the ...
The Young’s modulus can be determined as 𝐸=4𝜌·𝑙2·𝑓2,E=4ρ·l2·f2, (2) where l and 𝜌ρ are the sample length and density, respectively. The relative standard deviation of the determination of the modulus of elasticity is 𝛿𝐸/𝐸=4·10−3δE/E=4·10−3...
Eice Young’s modulus of the ice layer 𝐸𝑐𝑙Ecl Young’s Modulus of the bulk cantilever material Rz Maximum peak to valley roughness Sdr Real area to projected area ratio 𝜏𝑖𝑛𝑡τint Interfacial shear stress 𝜀𝐸𝐹−𝑎𝑙εEF−al Amplitude of the strain ℎ𝑖𝑐...
Nanoindentation hardness measurements were reported at depths of 250 nm using the advanced dynamic hardness and modulus method provided by Nanomechanics, Inc. Using standard methods, the tip was cleaned, and the contact area function was analytically determined via analysis of the load–depth data ...