With the continuous decrease in device sizes and critical dimensions in the semiconductor industry, the ability to measure electrical properties locally with a high spatial resolution is vital for accurate device characterization and failure analysis. Here, Atomic force microscopy (AFM) offers real space...
This application note discusses PeakForce SECM, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical ma...
World's most extendable high-resolution AFM, enabled with high-speed PeakForce Tapping®, enhanced PeakForce QNM®, and FASTForce Volume
Phase imaging allows the investigation of physical characteristics of surfaces, such as modulus and adhesion Strengths Firstly, quantifying surface roughness Secondly, wafers up to 300 mm can be analyzed intact Thirdly, high spatial resolution
AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level.Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user...
The spatial resolution and the contrast in mechanical property mapping by atomic force microscopy (AFM) modes based on dynamic force-curve acquisition, HarmoniX (TM)(HMX) and Peak-Force-Tapping-QNW (TM)(PET-QNM) modes, are discussed in terms of contact radius, probe type and imaging ...
Designed for ultra-high speed and spatial resolution Select the ideal balance between imaging speed and imaging resolution for your experiments Easily and consistently achieve higher resolution than other AFM’s The Vero VRS1250 enables true video-rate imaging at rates up to 45 frames/second Stable ...
neaSNOM proofed to be the system with the highest spatial resolution in infrared imaging and spectroscopy and brings us substantial new insights for our research” 陈焕君 教授 中山大学 Sun Yat-sen University "The neaSNOM microscope boosted my research in plasmonic properties of noble metal ...
I. 空間解析度(spatial resolution的影響在以探針為偵測主力的儀器中,針尖的大小是能否得到接近真實表面的關鍵。愈 小的針尖愈能得到接近真實表面的形貌圖,而 AFM的針尖尺寸遠小於SP,因此 預期AFM可以得到較真實的表面形貌圖。而由實際的量測中(如圖九,只比較 一度空間)也可得到證明,AFM確實有較好的結果。若將...
XY stage range（样品台范围）：8×8 mmZ stage range（升降范围）：10 mmSpatial resolution（光学分辨率）：1.5 μmX-Y-Z 扫描范围：50 µm × 50 µm × 6 µm激光器波数范围：FASTspectra OPO 2700 – 3600 cm-1，MIRcat QCL 800 – 1800 cm-1 设备与服务介绍 材料与器件检测技术中心配备三...