Probe tips (~5渭m high) and nanowires of ~25nm diameter were obtained successfully. In the range evaluated, the measurement resolution of the CuO nanowire probe was slightly worse than that of a commercial AFM probe. However, both probes had almost the same dimensional measurement precision....
AFM Probe Fabrication Silicon AFM probes are ‘carved out’ from single-crystal silicon wafers. The wafers are patterned in a microfabrication process similar to the one used in silicon chip manufacturing. The fabrication process consists of more than 100 steps and it takes a couple of months to...
Advanced design and fabrication process toolset In-house probes design team that collaborates with Bruker AFM scientists and engineers Agile production team that produces a wide variety of different probes Comprehensive quality system ensuring industry-leading probe performance ...
Scientists from Friedrich-Schiller-University Jena were successful in improving a fabrication process for atomic force microscopy (AFM) probe tips. Stephanie Hoeppener is working with an atomic force microscope for which a Jena research team has developed a procedure to produce sharper probes. (...
AFM-Raman and its TERS mode are used to show nanoscale surface mapping of structural defects and chemical groups on graphene oxide (GO) flakes with 10 nm spatial resolution. TERS mapping is combined with Kelvin probe force microscopy measurements for simultaneous topographical, electronic and chemical...
Characterizing critical dimensions of various component structures is an essential step to provide quality control feedback on fabrication processes In this webinar, Bruker AFM experts discuss and demonstrate the applications of AFM in the characterization of trenches, lines, and grat...
Sample cells are constructed so that only fused silica and the probe clip (PEEK or stainless steel) are in contact with liquid Optional glovebox configuration allows use with oxygen or water sensitive materials You may also be interested in... ...
Advanced design and fabrication process toolset In-house probes design team that collaborates with Bruker AFM scientists and engineers Agile production team that produces a wide variety of different probes Comprehensive quality system ensuring industry-leading probe performancePerformance...
Watch our video on building an "instant" Atomic Force Microscope (AFM) or other Scanned Probe Microscope (SPM). See how easy it is to assemble a low cost, high performance, closed loop AFM using theSPM-M kit, anAkiyama Probe, manual coarse positioners, and additional hardware. ...
1026 Indirect tip fabrication for Scanning Probe MicroscopyJ.P. Rasmussen, O. Hansen, S. Bouwstra, A. BoisenMicroelectronic Engineering, 30 (1996), 1-4, 579-582 1033 Melnikov-Based Dynamical Analysis of Microcantilevers in Scanning Probe MicroscopyM. Ashhab, M. V. Salapaka, M. Dahleh, ...