Initially, static PAT limits may be used to test a pre-defined population of N units (N = 500 or 1000, for instance). Using the data generated, lot specific PAT limits will be established. These generated static limits will become the new test limits (the counter will be reset to zero)...
improve the quality and reliability of parts supplied per AEC - Q100 and Q101. PAT is not intended to be a requirement, unless specified in the applicable procurement document or specifically approved by the user as a substitute for ELFR. (Note: The failures from ELFR and ...
本指南提出了一种基于统计的方法,称为部件平均测试 (PAT),用于从按照 AEC-Q100 和 AEC-Q101 提供的半导体中去除具有异常特性(异常值)的部件。 PAT 中使用的测试限制是根据具有独特设计和处理的特定部件的电气测试结果样本确定的。每个零件设计及其相关处理将显示每个测试要求的测试结果的独特分布,该数据是建立 PAT ...
AEC-Q001 AEC - Q001 - Rev-C July 18, 2003 GUIDELINES FOR PART AVERAGE TESTING Component Technical Committee Automotive Electronics Council
The test limits used in PAT are established based on a sample of the electrical test results for that particular part with its unique design and processing. Each part design and its associated processing will show a unique distribution of test results for each test requirement and this data is...
需要金币:*** 金币(10金币=人民币1元) AEC - Q001 Rev - D Guidelines for Part Average Testing零件平均测试指南.pdf 关闭预览 想预览更多内容,点击免费在线预览全文 免费在线预览全文 AEC - Q001 Rev-D December 9, 2011 Automotive Electronics Council Component Technical Committee GUIDELINES FOR PART AVE...
AEC_Q001_Rev_D AEC - Q001 Rev-D December 9, 2011 Automotive Electronics Council Component Technical Committee GUIDELINES FOR PART AVERAGE TESTING